화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Epitaxial growth of fully relaxed Si0.75Ge0.25 on SOI substrate
Xue ZY, Wei X, Zhang B, Wu AM, Zhang MA, Wang X
Applied Surface Science, 257(11), 5021, 2011
2 High Ge fraction intrinsic SiGe-heterochannel MOSFETs with embedded SiGe source/drain electrode formed by in-situ doped selective CVD epitaxial growth
Takehiro S, Sakuraba M, Tsuchiya T, Murota J
Thin Solid Films, 517(1), 346, 2008
3 Fabrication of 0.12 mu m pMOSFETs on high Ge fraction Si/Si1-xGex/Si(100) heterostructure with ultrashallow source/drain formed using B-doped SiGeCVD
Lee D, Takehiro S, Sakuraba M, Murota J, Tsuchiya T
Applied Surface Science, 224(1-4), 254, 2004