화학공학소재연구정보센터
검색결과 : 8건
No. Article
1 Oxygen incorporated during deposition determines the crystallinity of magnetron-sputtered Ta3N5 films
Rudolph M, Vickridge I, Foy E, Alvarez J, Kleider JP, Stanescu D, Magnan H, Herlin-Boime N, Bouchet-Fabre B, Minea T, Hugon MC
Thin Solid Films, 685, 204, 2019
2 Structure dependent resistivity and dielectric characteristics of tantalum oxynitride thin films produced by magnetron sputtering
Cristea D, Crisan A, Cretu N, Borges J, Lopes C, Cunha L, Ion V, Dinescu M, Barradas NP, Alves E, Apreutesei M, Munteanu D
Applied Surface Science, 354, 298, 2015
3 Composition and structure variation for magnetron sputtered tantalum oxynitride thin films, as function of deposition parameters
Cristea D, Patru M, Crisan A, Munteanu D, Craciun D, Barradas NP, Alves E, Apreutesei M, Moura C, Cunha L
Applied Surface Science, 358, 508, 2015
4 Development of tantalum oxynitride thin films produced by PVD: Study of structural stability
Cristea D, Crisan A, Barradas NP, Alves E, Moura C, Vaz F, Cunha L
Applied Surface Science, 285, 19, 2013
5 The resistive switching characteristics in TaON films for nonvolatile memory applications
Chen MC, Chang TC, Chiu YC, Chen SC, Huang SY, Chang KC, Tsai TM, Yang KH, Sze SM, Tsai MJ
Thin Solid Films, 528, 224, 2013
6 Structures and photocatalytic behavior of tantalum-oxynitride thin films
Hsieh JH, Li C, Liang HC
Thin Solid Films, 519(15), 4699, 2011
7 Multi-technique characterization of tantalum oxynitride films prepared by reactive direct current magnetron sputtering
Venkataraj S, Kittur H, Drese R, Wuttig M
Thin Solid Films, 514(1-2), 1, 2006
8 Optical characteristics of sputtered tantalum oxynitride Ta(N,O) films
Jong CA, Chin TS
Materials Chemistry and Physics, 74(2), 201, 2002