검색결과 : 25건
No. | Article |
---|---|
1 |
A universal 3D imaging sensor on a silicon photonics platform Rogers C, Piggott AY, Thomson DJ, Wiser RF, Opris IE, Fortune SA, Compston AJ, Gondarenko A, Meng FF, Chen X, Reed GT, Nicolaescu R Nature, 590(7845), 2021 |
2 |
Torque-mixing magnetic resonance spectroscopy Losby JE, Sani FF, Grandmont DT, Diao Z, Belov M, Burgess JAJ, Compton SR, Hiebert WK, Vick D, Mohammad K, Salimi E, Bridges GE, Thomson DJ, Freeman MR Science, 350(6262), 798, 2015 |
3 |
The Changing Dielectric Properties of CHO Cells Can Be Used to Determine Early Apoptotic Events in a Bioprocess Braasch K, Nikolic-Jaric M, Cabel T, Salimi E, Bridges GE, Thomson DJ, Butler M Biotechnology and Bioengineering, 110(11), 2902, 2013 |
4 |
Compensation Doping in Conjugated Polymers: Engineering Dopable Heterojunctions for Modulating Conductivity in the Solid State Rahman GMA, Zhao JH, Thomson DJ, Freund MS Journal of the American Chemical Society, 131(43), 15600, 2009 |
5 |
Field-induced carrier generation in conjugated polymer semiconductors for dynamic, asymmetric junctions Pillai RG, Zhao JH, Freund MS, Thomson DJ Advanced Materials, 20(1), 49, 2008 |
6 |
Dynamic electrostatic force-gradient microscopy employing mechanoelectric cross modulation Weng Z, Kaminski T, Bridges GE, Thomson DJ Journal of Vacuum Science & Technology A, 24(3), 673, 2006 |
7 |
Direct evidence of "spring softening" nonlinearity in micromachined mechanical resonator using optical beam deflection technique Zhao JH, Bridges GE, Thomson DJ Journal of Vacuum Science & Technology A, 24(3), 732, 2006 |
8 |
Resolution enhancement in probing of high-speed integrated circuits using dynamic electrostatic force-gradient microscopy Weng Z, Kaminski I, Bridges GE, Thomson DJ Journal of Vacuum Science & Technology A, 22(3), 948, 2004 |
9 |
Quantitative voltage measurement of high-frequency internal integrated circuit signals by scanning probe microscopy Weng Z, Falkingham CJ, Bridges GE, Thomson DJ Journal of Vacuum Science & Technology A, 20(3), 999, 2002 |
10 |
Capacitance sensor with sub-zeptofarad ((10-21) F) sensitivity for scanning capacitance microscopy Tran T, Oliver DR, Thomson DJ, Bridges GE Journal of Vacuum Science & Technology B, 20(1), 479, 2002 |