화학공학소재연구정보센터
검색결과 : 25건
No. Article
1 A universal 3D imaging sensor on a silicon photonics platform
Rogers C, Piggott AY, Thomson DJ, Wiser RF, Opris IE, Fortune SA, Compston AJ, Gondarenko A, Meng FF, Chen X, Reed GT, Nicolaescu R
Nature, 590(7845), 2021
2 Torque-mixing magnetic resonance spectroscopy
Losby JE, Sani FF, Grandmont DT, Diao Z, Belov M, Burgess JAJ, Compton SR, Hiebert WK, Vick D, Mohammad K, Salimi E, Bridges GE, Thomson DJ, Freeman MR
Science, 350(6262), 798, 2015
3 The Changing Dielectric Properties of CHO Cells Can Be Used to Determine Early Apoptotic Events in a Bioprocess
Braasch K, Nikolic-Jaric M, Cabel T, Salimi E, Bridges GE, Thomson DJ, Butler M
Biotechnology and Bioengineering, 110(11), 2902, 2013
4 Compensation Doping in Conjugated Polymers: Engineering Dopable Heterojunctions for Modulating Conductivity in the Solid State
Rahman GMA, Zhao JH, Thomson DJ, Freund MS
Journal of the American Chemical Society, 131(43), 15600, 2009
5 Field-induced carrier generation in conjugated polymer semiconductors for dynamic, asymmetric junctions
Pillai RG, Zhao JH, Freund MS, Thomson DJ
Advanced Materials, 20(1), 49, 2008
6 Dynamic electrostatic force-gradient microscopy employing mechanoelectric cross modulation
Weng Z, Kaminski T, Bridges GE, Thomson DJ
Journal of Vacuum Science & Technology A, 24(3), 673, 2006
7 Direct evidence of "spring softening" nonlinearity in micromachined mechanical resonator using optical beam deflection technique
Zhao JH, Bridges GE, Thomson DJ
Journal of Vacuum Science & Technology A, 24(3), 732, 2006
8 Resolution enhancement in probing of high-speed integrated circuits using dynamic electrostatic force-gradient microscopy
Weng Z, Kaminski I, Bridges GE, Thomson DJ
Journal of Vacuum Science & Technology A, 22(3), 948, 2004
9 Quantitative voltage measurement of high-frequency internal integrated circuit signals by scanning probe microscopy
Weng Z, Falkingham CJ, Bridges GE, Thomson DJ
Journal of Vacuum Science & Technology A, 20(3), 999, 2002
10 Capacitance sensor with sub-zeptofarad ((10-21) F) sensitivity for scanning capacitance microscopy
Tran T, Oliver DR, Thomson DJ, Bridges GE
Journal of Vacuum Science & Technology B, 20(1), 479, 2002