| 1 |
Low temperature growth of Ge1-xSnx buffer layers for tensile-strained Ge layers
Shimura Y, Tsutsui N, Nakatsuka O, Sakai A, Zaima S
Thin Solid Films, 518, S2, 2010 |
| 2 |
Improved production of isoamyl acetate by a sake yeast mutant resistant to an isoprenoid analog and its dependence on alcohol acetyltransferase activity, but not on isoamyl alcohol production
Hirooka K, Yamamoto Y, Tsutsui N, Tanaka T
Journal of Bioscience and Bioengineering, 99(2), 125, 2005 |
| 3 |
Growth of high quality 4in diameter Li2B4O7 single crystals
Tsutsui N, Ino Y, Imai K, Senguttuvan N, Ishii M
Journal of Crystal Growth, 229(1), 283, 2001 |
| 4 |
Growth of large size LBO (Li2B4O7) single crystals by modified Bridgman technique
Tsutsui N, Ino Y, Imai K, Senguttuvan N, Ishii M
Journal of Crystal Growth, 211(1-4), 271, 2000 |
| 5 |
A plasma-polymerized protective film for transmission electron microscopy specimen preparation by focused ion beam etching
Kato NI, Miura N, Tsutsui N
Journal of Vacuum Science & Technology A, 16(3), 1127, 1998 |
| 6 |
Nanostructural Characterization of Thin-Film Transistors Using a Combination of Scanning Force Microscopy and Transmission Electron-Microscopy
Tsuji S, Tsujimura T, Tsujimoto K, Tsutsui N, Miura N, Kuroda K, Saka H
Journal of Vacuum Science & Technology A, 14(3), 1714, 1996 |
| 7 |
Effects of Y or Gd Addition on the Structures and Resistivities of Al Thin-Films
Takayama S, Tsutsui N
Journal of Vacuum Science & Technology A, 14(4), 2499, 1996 |
| 8 |
Low-Resistivity Al-Re (Re=la, Pr, and Nd) Alloy Thin-Films with High Thermal-Stability for Thin-Film-Transistor Interconnects
Takayama S, Tsutsui N
Journal of Vacuum Science & Technology B, 14(5), 3257, 1996 |
| 9 |
Investigation of Thin-Film Transistors Using a Combination of Focused Ion-Beam Etching and Cross-Sectional Transmission Electron-Microscopy Observation
Tsuji S, Tsujimoto K, Tsutsui N, Miura N, Kuroda K, Saka H
Thin Solid Films, 281-282, 562, 1996 |
| 10 |
Al-Sm and Al-Dy Alloy Thin-Films with Low-Resistivity and High Thermal-Stability for Microelectronic Conductor Lines
Takayama S, Tsutsui N
Thin Solid Films, 289(1-2), 289, 1996 |
