검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Nondestructive Depth Profiling in Auger-Electron Spectroscopy by Means of Partial Intensity Analysis Werner WS Journal of Vacuum Science & Technology A, 15(3), 465, 1997 |
| 2 |
Comparison of Angle-Resolved X-Ray Photoelectron-Spectroscopy Auger-Electron Spectroscopy with Depth Profile Restoration from Inelastic Background Analysis Werner WS, Tilinin IS Journal of Vacuum Science & Technology A, 12(4), 2337, 1994 |