화학공학소재연구정보센터
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No. Article
1 Use of Laser Reflectometry for End-Point Detection During the Etching of Magnetic Thin-Films
Khamsehpour B, Wilkinson CD, Chapman JN
Journal of Vacuum Science & Technology A, 15(4), 2069, 1997
2 Controlling the Strain and Light-Emission from Si-Si1-xGex Quantum Dots
Tang YS, Hicks SE, Ni WX, Torres CM, Hansson GV, Wilkinson CD
Thin Solid Films, 294(1-2), 304, 1997
3 High-Resolution Patterning of Thin Magnetic-Films to Produce Ultrasmall Magnetic Elements
Khamsehpour B, Wilkinson CD, Chapman JN, Johnston AB
Journal of Vacuum Science & Technology B, 14(5), 3361, 1996
4 Dry-Etching Damage in III-V Semiconductors
Murad S, Rahman M, Johnson N, Thoms S, Beaumont SP, Wilkinson CD
Journal of Vacuum Science & Technology B, 14(6), 3658, 1996
5 Effects of O-2 Addition to Sicl4/Sif4 and the Thickness of the Capping Layer on Gate Recess Etching of GaAs-Pseudomorphic High-Electron-Mobility Transistors
Murad SK, Cameron NI, Beaumont SP, Wilkinson CD
Journal of Vacuum Science & Technology B, 14(6), 3668, 1996
6 Selective Reactive Ion Etching of InGaAs and InP over InAlAs in Sicl4/Sif4/HBr Plasmas
Murad SK, Beaumont SP, Holland M, Wilkinson CD
Journal of Vacuum Science & Technology B, 13(6), 2344, 1995
7 Reflectance Modeling for in-Situ Dry Etch Monitoring of Bulk SiO2 and III-V Multilayer Structures
Hicks SE, Parkes W, Wilkinson JA, Wilkinson CD
Journal of Vacuum Science & Technology B, 12(6), 3306, 1994
8 Magnetically Confined Plasma Reactive Ion Etching of GaAs/AlGaAs/AlAs Quantum Nanostructures
Song YP, Wang PD, Torres CM, Wilkinson CD
Journal of Vacuum Science & Technology B, 12(6), 3388, 1994
9 Controlling the Profile of Nanostructures
Tsutsui K, Hu EL, Wilkinson CD
Journal of Vacuum Science & Technology B, 11(6), 2233, 1993
10 Very-Low Damage Etching of GaAs
Murad SK, Wilkinson CD, Wang PD, Parkes W, Sotomayortorres CM, Cameron N
Journal of Vacuum Science & Technology B, 11(6), 2237, 1993