검색결과 : 2건
No. | Article |
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1 |
Thermal-stress stability of yttrium oxide as a buffer layer of metal-ferroelectric-insulator-semiconductor field effect transistor Lee CK, Kim WS, Park HH, Jeon H, Pae YH Thin Solid Films, 473(2), 335, 2005 |
2 |
Structural and electrical properties of Nd2Ti2O7/Y2O3/Si structures through interface treatment Lee CK, Kim WS, Park HH Thin Solid Films, 464-65, 155, 2004 |