검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Direct assessment of relaxation and defect propagation in different as-grown and in situ post-growth annealed thin Ge/Si and step-graded Si1-xGex/Si buffer layers Yousif MYA, Nur O, Willander M, Patel CJ, Hernandez C, Campidelli Y, Bensahel D, Kyutt RN Solid-State Electronics, 45(11), 1869, 2001 |
| 2 |
Recent critical issues in Si/Si1-xGex/Si heterostructure FET devices Yousif MYA, Nur O, Willander M Solid-State Electronics, 45(11), 1931, 2001 |
| 3 |
On the performance of in situ B-doped P+ poly-Si1-xGex gate material for nanometer scale MOS technology Yousif MYA, Friesel M, Willander M, Lundgren P, Caymax M Solid-State Electronics, 44(8), 1425, 2000 |