검색결과 : 12건
| No. | Article |
|---|---|
| 1 |
DC Current-crowding estimation for SiGe:C heterojunction bipolar transistors Ramirez-Garcia E, Garduno-Nolasco E, Rodriguez-Mendez LM, Diaz-Albarran LM, Valdez-Perez D, Galaz-Larios MC, Aniel F, Zerounian N, Enciso-Aguilar MA Solid-State Electronics, 153, 1, 2019 |
| 2 |
Abnormal depletion of Cu metallization pads in line-bump-line solder joints under electron current stressing Ho CE, Yang CH, Chen CT, Chen BZ Thin Solid Films, 596, 216, 2015 |
| 3 |
Improved carrier extraction of solar cell using transparent current spreading layer Lin CW, Tsai YT Thin Solid Films, 570, 475, 2014 |
| 4 |
Analyzing the current crowding effect induced by oxygen adsorption of amorphous InGaZnO thin film transistor by capacitance-voltage measurements Huang SY, Chang TC, Chen MC, Jian FY, Chen SC, Chen TC, Jheng JL, Lou MJ, Yeh FS Solid-State Electronics, 69, 11, 2012 |
| 5 |
Effects of metal stacks and patterned metal profiles on the electromigration characteristics in super-thin AlCu interconnects for sub-0.13 mu m technology Lee MH, Kwon YM, Pyo SG, Lee HC, Han JW, Paik KW Thin Solid Films, 519(11), 3906, 2011 |
| 6 |
Comparison of theory and experiment in a modified BICFET/HFET structure Yao J, Cai J, Opper H, Basilica R, Garber R, Taylor GW Solid-State Electronics, 53(9), 979, 2009 |
| 7 |
Electric current effects in flip chip solder joints Wang CH, Chen SW Journal of the Chinese Institute of Chemical Engineers, 37(2), 185, 2006 |
| 8 |
Numerical study of current crowding phenomenon in complementary 4H-SiC JBS rectifiers Rang T, Higelin G, Kurel R Materials Science Forum, 457-460, 1045, 2004 |
| 9 |
Phase imaging of buried structures Yongsunthon R, Rous PJ, Stanishevsky A, Slegrist K, Williams ED Applied Surface Science, 210(1-2), 6, 2003 |
| 10 |
Al/Ti ohmic contacts to p-type ion-implanted 6H-SiC: Mono- and two-dimensional analysis of TLM data Moscatelli F, Scorzoni A, Poggi A, Cardinali GC, Nipoti R Materials Science Forum, 433-4, 673, 2002 |