검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
HfO2-based gate stacks transport mechanisms and parameter extraction Coignus J, Leroux C, Clerc R, Truche R, Ghibaudo G, Reimbold G, Boulanger F Solid-State Electronics, 54(9), 972, 2010 |
| 2 |
Temperature effect of metal-oxide-semiconductor field-effect-transistors' gate current evaluated with the mask dimensions Yeh CC, Neih CF, Chen YY, Gong J Solid-State Electronics, 52(2), 215, 2008 |