검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Modeling of electron gate current and post-stress drain current of p-type silicon-on-insulator MOSFETs Sheu CJ, Jang SL Solid-State Electronics, 47(4), 705, 2003 |
| 2 |
A non-local gate current and oxide trapping charge generation model for lightly doped drain and single-drain nMOSFETs Jang SL, Sheu CJ Solid-State Electronics, 44(7), 1305, 2000 |