검색결과 : 9건
| No. | Article |
|---|---|
| 1 |
Investigation of the temperature dependence of random telegraph noise fluctuations in nanoscale polysilicon-channel 3-D Flash cells Nicosia G, Goda A, Spinelli AS, Compagnoni CM Solid-State Electronics, 151, 18, 2019 |
| 2 |
Impact of the array background pattern on cycling-induced threshold-voltage instabilities in nanoscale NAND Flash memories Paolucci GM, Bertuccio M, Compagnoni CM, Beltrami S, Spinelli AS, Lacaita AL, Visconti A Solid-State Electronics, 113, 138, 2015 |
| 3 |
Ceria CMP Slurry for the Construction of Floating Gates in MLC NAND Flash Memory below 51 nm Kim YH, Kim JW, Kim SK, Paik U Electrochemical and Solid State Letters, 13(10), H339, 2010 |
| 4 |
Device characteristics of HfON charge-trap layer nonvolatile memory Lee T, Banerjee SK Journal of Vacuum Science & Technology B, 28(5), 1005, 2010 |
| 5 |
Sub-bandgap optical subthreshold current spectroscopy for extracting energy distribution of interface states in nitride-based charge trap flash memories Jeon K, Lee S, Kim DM, Kim DH Solid-State Electronics, 54(5), 557, 2010 |
| 6 |
Modeling of gate-all-around charge trapping SONOS memory cells Gnani E, Reggiani S, Gnudi A, Baccarani G, Fu J, Singh N, Lo GQ, Kwong DL Solid-State Electronics, 54(9), 997, 2010 |
| 7 |
Thermal Stability and Memory Characteristics of HfON Trapping Layer for Flash Memory Device Applications Jeon S Electrochemical and Solid State Letters, 12(11), H412, 2009 |
| 8 |
Silicon-oxide-high-kappa-oxide-silicon memory using a high-kappa Y2O3 nanocrystal film for flash memory application Pan TM, Yeh WW Journal of Vacuum Science & Technology A, 27(4), 700, 2009 |
| 9 |
Full field imprint masks using variable shape beam pattern generators Selinidis K, Thompson E, Schmid G, Stacey N, Perez J, Maltabes J, Sreenivasan SV, Resnick DJ, Fujii A, Sakai Y, Sasaki S, Hayashi N Journal of Vacuum Science & Technology B, 26(6), 2410, 2008 |