화학공학소재연구정보센터
검색결과 : 4건
No. Article
1 Modeling short-channel effects in channel thermal noise and induced-gate noise in MOSFETs in the NQS regime
Vallur S, Jindal RP
Solid-State Electronics, 53(1), 36, 2009
2 Modeling non-quasi-static effects in channel thermal noise and induced-gate noise in MOS field-effect transistors
Deshpande A, Jindal RP
Solid-State Electronics, 52(5), 771, 2008
3 A unified model for high-frequency current noise of MOSFETs
Teng HF, Jang SL, Juang MH
Solid-State Electronics, 47(11), 2043, 2003
4 High frequency thermal noise modelling of short-channel MOSFET's
Signoracci L, Turchetti C, Orcioni S
Solid-State Electronics, 45(2), 205, 2001