검색결과 : 15건
| No. | Article |
|---|---|
| 1 |
The effect of Ni:Si ratio on microstructural properties of Ni/Si ohmic contacts to SiC Wzorek M, Borysiewicz MA, Czerwinski A, Mysliwiec M, Ekielski M, Ratajczak J, Piotrowska A, Katcki J Applied Surface Science, 369, 535, 2016 |
| 2 |
Nickel silicides prepared from organometallic polymer as efficient catalyst towards hydrogenation of phenylacetylene Yang KX, Chen X, Guan JC, Liang CH Catalysis Today, 246, 176, 2015 |
| 3 |
Growth and structural property studies on NiSi/SiC core-shell nanowires by hot-wire chemical vapor deposition Nazarudin NFFB, Azizan SNAB, Rahman SA, Goh BT Thin Solid Films, 570, 243, 2014 |
| 4 |
Raman study of Ni and Ni silicide contacts on 4H-and 6H-SiC Cichon S, Machac P, Barda B, Machovic V, Slepicka P Thin Solid Films, 520(13), 4378, 2012 |
| 5 |
Experimental and theoretical positron annihilation studies on bulk nickel silicides Abhaya S, Rajaraman R, Amarendra G Applied Surface Science, 255(1), 142, 2008 |
| 6 |
Silicidation in Ni/Si thin film system investigated by X-ray diffraction and Auger electron spectroscopy Abhaya S, Amarendra G, Kalavathi S, Gopalan P, Kamruddin M, Tyagi AK, Sastry VS, Sundar CS Applied Surface Science, 253(8), 3799, 2007 |
| 7 |
Phase formation at rapid thermal annealing of nickel contacts on C-face n-type 4H-SiC. Ferrero S, Albonico A, Meotto UM, Rombola G, Porro S, Giorgis F, Perrone D, Scaltrito L, Bontempi E, Depero LE, Richieri G, Merlin L Materials Science Forum, 483, 733, 2005 |
| 8 |
In-line phase and texture control in microelectronics industry Kozaczek K Materials Science Forum, 495-497, 1343, 2005 |
| 9 |
Lateral growth and three-dimensional effects in contacts between NiSi0.82Ge0.18 and p(+)-Si0.82Ge0.18 Persson S, Isheden C, Jarmar T, Zhang SL Thin Solid Films, 489(1-2), 159, 2005 |
| 10 |
Enhanced phase stability and morphological stability of Ni(Si,Ge) on strained Si0.8Ge0.2 Seger J, Zhang SL Thin Solid Films, 429(1-2), 216, 2003 |