검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Worst-case analysis and statistical simulation of MOSFET devices based on parametric test data Zhang Q, Liou JJ, McMacken J, Thomson JR, Stiles K, Layman P Solid-State Electronics, 45(9), 1537, 2001 |
| No. | Article |
|---|---|
| 1 |
Worst-case analysis and statistical simulation of MOSFET devices based on parametric test data Zhang Q, Liou JJ, McMacken J, Thomson JR, Stiles K, Layman P Solid-State Electronics, 45(9), 1537, 2001 |