검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Study of plasma charging-induced white pixel defect increase in CMOS active pixel sensor Tokashiki K, Bai K, Baek K, Kim Y, Min G, Kang C, Cho H, Moon J Thin Solid Films, 515(12), 4864, 2007 |
| 2 |
Threshold voltage shift of submicron p-channel MOSFET due to Si surface damage from plasma etching process Kim GH, Kang YR, Kim WJ, Kim SY, Kim CI Thin Solid Films, 515(12), 4892, 2007 |
| 3 |
Dependence of the performance and reliability of n-metal-oxide-silicon field effect transistors on interlayer dielectric processing Trabzon L, Awadelkarim OO, Werking J Journal of Vacuum Science & Technology B, 17(5), 2216, 1999 |