화학공학소재연구정보센터
검색결과 : 327건
No. Article
1 Hydrogen distribution of hydrogen-charged nickel analyzed via hardness test and secondary ion mass spectrometry
Yamabe J, Wada K, Awane T, Matsunaga H
International Journal of Hydrogen Energy, 45(15), 9188, 2020
2 양자우물구조에 의한 태양전지 단락전류 증가 효과와 이차이온 질량분석법에 의한 원소 정량 분석
김정환
Applied Chemistry for Engineering, 30(4), 499, 2019
3 Effect of mass segment size on polymer ToF-SIMS multivariate analysis using a universal data matrix
Madiona RMT, Winkler DA, Muir BW, Pigram PJ
Applied Surface Science, 478, 465, 2019
4 Optimal machine learning models for robust materials classification using ToF-SIMS data
Madiona RMT, Winkler DA, Muir BW, Pigram PJ
Applied Surface Science, 487, 773, 2019
5 ToF-SIMS depth profiling of nanoparticles: Chemical structure of core-shell quantum dots
Gulin A, Shakhov A, Vasin A, Astafiev A, Antonova O, Kochev S, Kabachii Y, Golub A, Nadtochenko V
Applied Surface Science, 481, 144, 2019
6 Structure and wettability of heterogeneous monomolecular films of phospholipids with cholesterol or lauryl gallate
Jurak M, Mroczka R, Lopucki R, Wiacek AE
Applied Surface Science, 493, 1021, 2019
7 Information content of ToF-SIMS data: Effect of spectral binning
Madiona RMT, Alexander DLJ, Winkler DA, Muir BW, Pigram PJ
Applied Surface Science, 493, 1067, 2019
8 고강도 구조용 철강소재의 대입열 용접 시 열영향부의 조직 미세화 및 기계적 특성 향상에 미치는 TiN 및 B의 효과
박진성, 황중기, 조재영, 한일욱, 이만재, 김성진
Korean Journal of Materials Research, 29(2), 97, 2019
9 Evaluation of sputtering induced surface roughness development of Ni/Cu multilayers thin films by Time-of-Flight Secondary Ion Mass Spectrometry depth profiling with different energies O-2(+) ion bombardment
Yan XL, Duvenhage MM, Wang JY, Swart HC, Terblans JJ
Thin Solid Films, 669, 188, 2019
10 Reaction of formaldehyde over birnessite catalyst: A combined XPS and ToF-SIMS study
Selvakumar S, Nuns N, Trentesaux M, Batra VS, Giraudon JM, Lamonier JF
Applied Catalysis B: Environmental, 223, 192, 2018