| 1 |
Investigation on millimeter-scale W1/O/W2 compound droplets generation in a co-flowing device with one-step structure
Pan D, Chen Q, Zhang Y, Li B
Journal of Industrial and Engineering Chemistry, 84, 366, 2020 |
| 2 |
Investigation on the surface characterization of Ga-faced GaN after chemical-mechanical polishing
Gong H, Pan GS, Zhou Y, Shi XL, Zou CL, Zhang SA
Applied Surface Science, 338, 85, 2015 |
| 3 |
XPS, UV-vis spectroscopy and AFM studies on removal mechanisms of Si-face SiC wafer chemical mechanical polishing (CMP)
Zhou Y, Pan GS, Shi XL, Xu L, Zou CL, Gong H, Luo GH
Applied Surface Science, 316, 643, 2014 |
| 4 |
Atomic surface structure of Si(100) substrates prepared in a chemical vapor environment
Doscher H, Kleinschmidt P, Hannappel T
Applied Surface Science, 257(2), 574, 2010 |
| 5 |
Anisotropy of lateral growth rate in liquid phase epitaxy of InP and its association with kink-step structures on the surface
Kochiya T, Oyama Y, Suto K, Nishizawa J
Applied Surface Science, 237(1-4), 235, 2004 |
| 6 |
Effect of thermal field on interface step structures during PVT growth of (0001)Si 6H-SiC
Herro ZG, Epelbaum BM, Bickermann M, Masri P, Winnacker A
Materials Science Forum, 457-460, 95, 2004 |
| 7 |
Ab initio study of silicon carbide: Bulk and surface structures
Raffy C, Magaud L, Blanquet E, Pons M, Pasturel A
Materials Science Forum, 353-356, 111, 2001 |
| 8 |
Correlation between the surface morphology and antiphase boundaries in ordered (GaIn)P
Sass T, Pietzonka I, Gottschalch V, Wagner G
Thin Solid Films, 348(1-2), 196, 1999 |
