| 1 |
Effect of complexing agent TEA: The structural, morphological, topographical and optical properties of FexSx nano thin films deposited by SILAR technique
Manikandan K, Mani P, Dilip CS, Valli S, Inbaraj PFH, Prince JJ
Applied Surface Science, 288, 76, 2014 |
| 2 |
Non-uniform stress distribution and deformation bifurcation of thin film/substrate system subjected to gradient temperature
Dong XL, Feng X, Hwang KC
Thin Solid Films, 519(8), 2464, 2011 |
| 3 |
Two-dimensional x-ray diffraction for structure and stress analysis
He BPB, Xu KW, Wang F, Huang P
Materials Science Forum, 490-491, 1, 2005 |
| 4 |
Preparation of (001)- and (114)-oriented epitaxial thin films of Bi2VO5.5 by a coating pyrolysis process
Tsukada K. Nagahama T, Sohma M, Yamaguchi I, Manabe T, Tsuchiya T, Suzuki S, Shimizu T, Mizuta S, Kumagai T
Thin Solid Films, 425(1-2), 97, 2003 |
| 5 |
Irreversing thermal expansivity of materials coated with adhesive thin films detected by modulated-temperature dilatometry and differential thermal analysis
Myslinski P, Kamasa P, Wasik A
Thermochimica Acta, 387(2), 131, 2002 |
| 6 |
Adhesion study of SiOx/PET films: Comparison between scratch test and fragmentation test
Pitton Y, Hamm SD, Lang FR, Mathieu HJ, Leterrier Y, Manson JAE
Journal of Adhesion Science and Technology, 10(10), 1047, 1996 |
