2549 - 2550 |
Special issue: Characterization of real materials and real processing by transmission electron microscopy - Preface Saka H |
2551 - 2552 |
Special issue: Characterization of real materials and real processing by transmission electron microscopy - Foreward Humphreys C |
2553 - 2557 |
Atomic structure of AlN/Al2O3 interfaces fabricated by pulsed-laser deposition Tokumoto Y, Sato Y, Yamamoto T, Shibata N, Ikuhara Y |
2559 - 2565 |
Comparison of the number densities of nanosized Cu-rich precipitates in ferritic alloys measured using EELS and EDX mapping, HREM and 3DAP Lozano-Perez S, Sha G, Titchmarsh JM, Jenkins ML, Hirosawa S, Cerezo A, Smith GDW |
2567 - 2571 |
Characterization of nanometer-sized Pt-dendrite structures fabricated on insulator Al2O3 substrate by electron-beam-induced deposition Xie GQ, Song MH, Mitsuishi K, Furuya K |
2573 - 2576 |
TEM study of Mg-Zn precipitates in Mg-Zn-Y alloys Rao JC, Song M, Furuya K, Yoshimoto S, Yamasaki M, Kawamura Y |
2577 - 2580 |
Electron beam-induced formation of nanosized alpha-Fe crystals Zhang W, Shimojo M, Takeguchi M, Furuya K |
2581 - 2585 |
The role of deformation twinning in the formation of a fine-grained structure in cold-rolled 310 steels Morikawa T, Higashida K |
2587 - 2595 |
Nanostructural characterization of YBCO films on metal tape with textured buffer layer fabricated by pulsed-laser deposition Kato T, Sasaki H, Sasaki Y, Hirayama T, Ikuhara Y, Watanabe T, Ibi A, Iwai H, Muroga T, Miyata S, Yamada Y, Iijima Y, Kakimoto K, Sutoh Y, Saitoh T, Izumi T, Shiohara Y |
2597 - 2600 |
Application of energy-filtering TEM to the nanocrystallization process in amorphous Fe84Nb7B9 alloy Hirata A, Hirotsu Y |
2601 - 2604 |
Dynamics and characters of dislocations in ZnSe Yonenaga I, Watanabe K, Itoh S, Fujiwara S |
2605 - 2610 |
Cube-phase in excess Mg-type Al-Mg-Si alloy studied by EFTEM Matsuda K, Ishida Y, Mullerova I, Frank L, Ikeno S |
2611 - 2614 |
Structural characterization of iron silicides nanoparticles grown on Si substrate: Annealing rate dependence Won JH, Sato K, Ishimari M, Hirotsu Y |
2615 - 2619 |
Structural investigation of Ge-Sb-Sn thin films using transmission electron microscopy Naito M, Ishimaru M, Hirotsu Y |
2621 - 2625 |
Dislocation structures of low-angle boundaries in Nb-doped SrTiO3 bicrystals Choi SY, Buban JP, Nishi M, Kageyama H, Shibata N, Yamamoto T, Kang SJL, Ikuhara Y |
2627 - 2630 |
Fabrication of a nano-magnet on a piezo-driven tip in a TEM sample holder Takeguchi M, Shimojo M, Che R, Furuya K |
2631 - 2639 |
Model for kink-like deformation in CoTi single crystals Zhang L, Jenkins ML, Taylor G |
2641 - 2646 |
From individual dislocation motion to collective behaviour Louchet F |
2647 - 2657 |
Comparison of glide mechanisms in hcp Ti and Ti3Al Legros M, Couret A, Caillard D |
2659 - 2665 |
Development of a real-time stereo TEM Tanaka H, Kojima T, Tsurutai H, Chen J, Tanji T, Ichihashi M |
2667 - 2671 |
Formation of iron silicide nano-islands on Si substrates by metal organic chemical vapor deposition under electron beams Tanaka M, Chu F, Shimojo M, Takeguchi M, Mitsuishi K, Furuya K |
2673 - 2677 |
Transmission electron microscopy study on the superstructure and the precipitation of gamma'-Fe4N in initially homogeneous epsilon-iron nitride powders Liu ZQ, Leineweber A, Mitsuishi K, Furuya K |
2679 - 2683 |
TEM observation of hydrogen permeable Si-M-O (M = Ni or Sc) membranes synthesized on mesoporous anodic alumina capillary tubes Yamazaki S, Uno N, Mori H, Ikuhara YH, Iwamoto Y, Kato T, Hirayama T |
2685 - 2690 |
The structure and properties of dislocations in GaN Cherns D, Hawkridge ME |
2691 - 2702 |
The weak-beam technique applied to the analysis of materials properties Veyssiere P |
2703 - 2710 |
The melting behavior of faceted particles embedded in the solid state: A family of Wulff shapes Siem EJ, Johnson E |
2711 - 2722 |
Insights into nanoparticle formation mechanisms Perry CR, Carter CB |
2723 - 2727 |
Size dependence of the contact angle of liquid clusters of Bi and Sn supported on SiO2, Al2O3, graphite, diamond and AlN Murai J, Maukawa T, Mima T, Arai S, Sasaki K, Saka H |
2729 - 2737 |
The impact of electron beam damage on the detection of indium-rich localisation centres in InGaN quantum wells using transmission electron microscopy Smeeton TM, Humphreys CJ, Barnard JS, Kappers MJ |