1 - 5 |
Synthesis and Characterization of a Novel Amphiphilic Elaidic Acid-Derivative Derue V, Alexandre S, Huguet J, Deschrevel B, Valleton JM |
6 - 9 |
Microstructure and Dielectric-Properties of Epitaxial Bi2Wo6 Deposited by Pulsed-Laser Ablation Hamada M, Tabata H, Kawai T |
10 - 16 |
Optical Indexes of Electrochromic Tungsten-Oxide Vonrottkay K, Rubin M, Wen SJ |
17 - 22 |
Theoretical Simulation of Resonance Raman Bands of Amorphous-Carbon Matsunuma S |
23 - 33 |
An Analytical Model for Predicting Residual-Stresses in Progressively Deposited Coatings .1. Planar Geometry Tsui YC, Clyne TW |
34 - 51 |
An Analytical Model for Predicting Residual-Stresses in Progressively Deposited Coatings .2. Cylindrical Geometry Tsui YC, Clyne TW |
52 - 61 |
An Analytical Model for Predicting Residual-Stresses in Progressively Deposited Coatings .3. Further Development and Applications Tsui YC, Clyne TW |
62 - 66 |
Mass-Transfer Surface-Diffusion of Noble-Gases Suni II |
67 - 73 |
Optical Study of Undoped, B-Doped or P-Doped Polysilicon Laghla Y, Scheid E |
74 - 77 |
Protective Oxide Coatings for Superconducting YBa2Cu3O7-X Thin-Films Aguiar R, Sanchez F, Ferrater C, Varela M |
78 - 85 |
Sol-Gel Preparation of ZnO Films with Extremely Preferred Orientation Along (002) Plane from Zinc Acetate Solution Ohyama M, Kozuka H, Yoko T |
86 - 91 |
Characterization of Yttria-Stabilized Zirconia Thin-Films Grown by Planar Magnetron Sputtering Tsai WC, Tseng TY |
92 - 99 |
Deposition and Optical-Properties of Optimized ZnS/Ag/ZnS Thin-Films for Energy-Saving Applications Leftheriotis G, Yianoulis P, Patrikios D |
100 - 104 |
Study on a Mixed Conducting Langmuir-Blodgett-Film Based on a New Asymmetrical Tetrathiafulvalene Li HQ, Liu D, Yao ZQ, Tan GZ, Yu XD |
105 - 111 |
Kinetic-Model for Molecular-Beam Epitaxial-Growth on a Singular Surface Trofimov VI, Mokerov VG, Shumyankov AG |
112 - 118 |
A Combined AC-DC Method for Investigating Supported Bilayer-Lipid Membranes Sabo J, Ottova A, Laputkova G, Legin M, Vojcikova L, Tien HT |
119 - 123 |
Study of the Adhesion Between A-CH Films and Ta6V Substrates by Electron-Induced X-Ray-Emission Spectroscopy (Exes) Jonnard P, Tixier C, Desmaison J, Hombourger C, Bonnelle C |
124 - 129 |
Measurement of the Interfacial Mechanical-Properties of a Thin Ceramic Coating on Ductile Substrates Shieu FS, Shiao MH |
130 - 132 |
Effect of Strain on Light-Emission from Pseudomorphic Si/Si1-xGex/Si Structures Kimura Y, Nakagawa K, Miyao M |
133 - 136 |
An All-Solid-State Electrochromic Display Device of Prussian Blue and WO3 Particulate Film with a PMMA Gel Electrolyte Su LY, Fang JH, Xiao ZD, Lu ZH |
137 - 140 |
Characterization of Femtosecond Laser-Pulses with GaN Thin-Films Wada A, Ho W, Khan MA |
141 - 146 |
High-Quality YBa2Cu3O7-X/Ndalo3/YBa2Cu3O7-X Trilayers on (100)MgO for Microwave Applications Rao MR |
147 - 153 |
Properties of 2nd-Phase (Basno3,Sn) Added-YBCO Thick-Films Ban E, Matsuoka Y |
154 - 159 |
2 Forms of Stilbazolium Merocyanine on Langmuir-Blodgett Monolayers Martynski T, Tateishi T, Miyake J, Ptak A, Frackowiak D |
160 - 162 |
Preparation of Caga2S4-Ce Tfel Devices with Inter-Layer Reaction Xu CX, Ma L, Cao L, Xu Z, Lou ZD, Liu XG, Xu XR |
163 - 170 |
Chemical Influences on the Luminescence of Ruthenium Diimine Complexes and Its Response to Oxygen Mills A, Williams FC |
171 - 173 |
Nondestructive, Interferometric Method for Measuring the Thickness of a Silicon Membrane Adee JM, Steinbruchel C |
174 - 177 |
Mechanical-Stress in Amorphous Ge-as-S(Se) Film Si Substrate System Christova K, Dimitrova Z, Skordeva E |
178 - 178 |
Yttria-Stabilized Zirconia Thin-Films Grown by Reactive RF Magnetron Sputtering (Vol 287, Pg 104, 1996) Tomaszewski H, Haemers J, Denul J, Deroo N, Degryse R |