1 - 7 |
Microstructural Development in Physical Vapor-Deposited Partially-Stabilized Zirconia Thermal Barrier Coatings Sohn YH, Biederman RR, Sisson RD |
8 - 15 |
Preparation and Characteristics of Y2O3-Doped CeO2 Film by RF Magnetron Sputtering Sugie Y, Mineshige A, Kobune M, Fujii S |
16 - 19 |
Evaluation of New High-Temperature Boron Solid Planar Diffusion Sources Through P-N Junction Characterization Hwang DK, Tressler RE, Ruzyllo J |
20 - 25 |
Characterization of Cobalt Annealed on Silicon-Germanium Epilayers Lin F, Sarcona G, Hatalis MK, Cserhati AF, Austin E, Greve DW |
26 - 32 |
Direct-Current Reactive Magnetron-Sputtered Zinc-Oxide Thin-Films - The Effect of the Sputtering Pressure Meng LJ, Dossantos MP |
33 - 36 |
Optical-Properties of Laser-Evaporated Cugase2 Films Near and Above the Fundamental Absorption-Edge Kindyak VV, Kindyak AS, Gremenok VF, Bodnar IV, Rud YV, Medvedkin GA |
37 - 41 |
Surface Strains and Measurements of Misfit Dislocation Density by Diffraction Methods in Thin-Films on Substrates Junqua N, Grilhe J |
42 - 46 |
Growth Modes of Epitaxial Copper-Films on C-Sapphire Knoll E, Bialas H |
47 - 52 |
Study of Lithium Intercalation into Tungsten-Oxide Films Prepared by Different Methods Badilescu S, Ashrit PV, Minhha N, Bader G, Girouard FE, Truong VV |
53 - 55 |
Combined Reaction and Diffusion-Controlled Kinetics of Silicidation Borisenko VE, Ivanenko LI, Krushevski EA |
56 - 60 |
Growth and Structure of Polycrystalline Cr/Au Multilayered Thin-Films Bruckl H, Vancea J, Lecheler R, Reiss G, Hoffmann H |
61 - 66 |
Oxidation of Iron, Aluminum and Titanium Films in the Temperature-Range 50-200-Degrees-C Martin M, Mader W, Fromm E |
67 - 71 |
Experimental-Study of the Copper Thiosulfate System with Respect to Thin-Film Deposition Grozdanov I, Barlingay CK, Dey SK, Ristov M, Najdoski M |
72 - 80 |
Development of Crystallinity and Morphology in Hafnium Dioxide Thin-Films Grown by Atomic Layer Epitaxy Ritala M, Leskela M, Niinisto L, Prohaska T, Friedbacher G, Grasserbauer M |
81 - 86 |
Real-Time Ir and Mass Spectroscopic Study of the Reaction Process of Wf6 and A-Si-H-F Wadayama T, Shibata H, Ohtani T, Hatta A |
87 - 91 |
Electrochemical-Behavior of Surface Zirconium-Oxides in the Presence of Some Electroactive Species Mogoda AS, Hefny MM, Salih SA, Elfaiky HE |
92 - 100 |
Electronic and Crystallographic Structure of Gamma-Alumina Thin-Films Ealet B, Elyakhloufi MH, Gillet E, Ricci M |
101 - 110 |
Growth and Properties of Thin Ag Films on Pt(100) Surfaces Struber U, Kastner A, Kuppers J |
111 - 114 |
Reactions in Au/Nb Bilayer Thin-Films Kitada M |
115 - 125 |
The Influence of Substrate Chemistry on the Adhesion of Electrolessly Deposited Ni(P) on Metal-Oxide Coated Ceramics Severin JW, Vanweert AA, Dewith G |
126 - 131 |
Surface Physical and Chemical-Changes of Pure Iron After Molybdenum Ion-Implantation and Their Effects on the Tribological Behavior .2. Tribological Behavior Yang DH, Zhang XS, Xue QJ, Ding XJ, Lin WL |
132 - 134 |
Phase-Structure Characteristics of RF Reactively Sputtered Zirconia Thin-Film Wang YH, Li XP |
135 - 141 |
Yttrium-Oxide Film Deposition by a Langmuir-Blodgett Processing Technique and Its Incorporation into Oxide Scales by Substrate Oxidation Laursen T, Johnson DJ, Amm DT, Haysom JE |
142 - 150 |
Alumina Coatings on PMMA - Optimization of Adherence Duchatelard P, Baud G, Besse JP, Jacquet M |
151 - 156 |
A Comparison of 3 Techniques for Measuring Strain at Fracture of Thin-Film Materials Goforth RC, Chandran B, Ulrich RK, Nasrazadani S |
157 - 163 |
Hardness, Internal-Stress and Fracture-Toughness of Epitaxial AlxGa1-xAs Films Hjort K, Ericson F, Schweitz JA, Hallin C, Janzen E |
164 - 171 |
Thermal Strain in Indium Thin-Films Deposited on GaAs Substrates Ijichi H, Tadanaga O, Otsuki A, Murakami M |
172 - 180 |
Investigation of Residual-Stress Generation During Thermal Spraying by Continuous Curvature Measurement Gill SC, Clyne TW |
181 - 186 |
Evaluation of Coating Substrate Interface Strength by Differential Load Feed Analysis of Load-Indentation Measurements Rother B, Dietrich DA |
187 - 193 |
Correlation of Structure and Optical-Properties of an Annealed Hydrogenated Amorphous Silicon-Carbon Alloy Film Basa DK |
194 - 201 |
Alpha-Fe2O3 Thin-Films Prepared by Metalorganic Deposition (MOD) from Fe(III) 2-Ethylhexanoate Xue S, Ousibenomar W, Lessard RA |
202 - 205 |
Optical-Properties of a Strained GaAs/Si Heterostructure After Rapid Thermal Annealing Kim DY, Kang TW, Kim TW |
206 - 212 |
RF Plasma Deposition from Hexamethyldisiloxane Oxygen Mixtures Sahli S, Segui Y, Ramdani S, Takkouk Z |
213 - 218 |
Quasi-Monolayer Deposition of Silicon Dioxide Gasser W, Uchida Y, Matsumura M |
219 - 231 |
Anisotropic Spin Transport in Oriented Lithium Phthalocyanine Thin-Films Wachtel H, Wittmann JC, Lotz B, Petit MA, Andre JJ |
232 - 237 |
Molecular-Beam Epitaxial-Growth of Smba2Cu3O7-Delta Thin-Films and Effect of Substrate-Temperature on the Surface-Roughness Schindler W, Vanhasselt P, Markl J, Bauer P, Tontsch P, Saemannischenko G |
238 - 242 |
Fabrication of Thin Crystal Films of Organic-Compounds Ivakin GI, Klechkovskaya VV, Sukhorukov GB |
243 - 248 |
Local-Structure of Metal-Ions in Arachidate Langmuir-Blodgett-Film Takeuchi S, Nogami Y, Ishiguro T, Oyanagi H |
249 - 257 |
Ordered Langmuir-Blodgett-Films of a Substituted Lutetium Bisphthalocyanine Jones R, Hunter RA, Davidson K |
258 - 262 |
Work Function Measurements for Gas-Detection Using Tin Oxide Layers with a Thickness Between 1-nm and 200-nm Flietner B, Eisele I |
263 - 267 |
Dielectric-Properties of AlN Films Prepared by Laser-Induced Chemical-Vapor-Deposition Li X, Tansley TL, Chin VW |
268 - 272 |
Target Current Spectroscopy of the Alkali-Halides KCl, CsCl and KBr Alidjanov EK, Atabaev BG, Gaipov S, Boltaev NN |
273 - 278 |
Optical and Structural Characterizations of Cu+-Doped KCl Films Oliveira L, Cruz CM, Silva MA, Li MS |