1 - 7 |
Defect generation in multi-stacked InAs quantum dot/GaAs structures Roh CH, Park YJ, Kim KM, Park YM, Kim EK, Shim KB |
8 - 12 |
In situ visualization of interface dynamics during the double laser recrystallization of amorphous silicon thin films Lee M, Moon S, Grigoropoulos CP |
13 - 18 |
Improvement in the quality of ZnSe epilayers grown on (001) GaAs by the low temperature growth of a thin ZnSe buffer layer Zhang XB, Ha KL, Hark SK |
19 - 30 |
The impact of nitrogen on the defect aggregation in silicon von Ammon W, Holzl R, Virbulis J, Dornberger E, Schmolke R, Graf D |
31 - 38 |
Effect of V/III ratio and PH3 annealing on InAs dots grown by MOVPE on InP(001) step-bunched surfaces Souliere V, Dumont H, Auvray L, Monteil Y |
39 - 46 |
Surface morphology investigation of Si thin film grown by temperature modulation Si molecular-layer epitaxy Nishizawa J, Murai A, Oizumi T, Kurabayashi T, Kanamoto K, Yoshida T |
47 - 51 |
Czochralski growth of heavily impurity doped crystals of GeSi alloys Yonenaga I |
52 - 56 |
Properties of Mg doped GaAs grown by molecular beam epitaxy Kim JS, Bae IH, Leem JY, Noh SK, Lee JI, Kim JS, Kim SM, Son JS, Jeon M |
57 - 61 |
Polarity dependence of hexagonal inclusions and cubic twins in GaN/GaAs(001) epilayers measured by conventional X-ray pole figure and grazing incident diffraction pole figure Qu B, Zheng XH, Wang YT, Lin SM, Yang H, Liang JW |
62 - 66 |
Growth of nano-crystalline diamond by pulsed laser deposition in oxygen atmosphere Chen ZY, Zhao JP, Yano T, Ooie T, Yoneda M, Sakakibara J |
67 - 72 |
Electrodeposition of p-WS2 thin film and characterisation Devadasan JJ, Sanjeeviraja C, Jayachandran M |
73 - 78 |
A selective growth of III-nitride by MOCVD for a buried-ridge type structure Yang M, Cho M, Kim C, Yi J, Jeon J, Khym S, Kim M, Choi Y, Leem SJ, Lee YH |
79 - 82 |
Growth of large PbWO4 single crystals by Czochralski method Yang C, Guo Y, Shi P, Chen G |
83 - 87 |
Influence of a magnetic field on melt-growth process of YBa2Cu3Ox Awaji S, Watanabe K, Motokawa M |
88 - 94 |
Raman spectroscopic characterization of diamond films grown in a low-pressure flat flame Wolter SD, Prater JT, Sitar Z |
95 - 100 |
Control of Nd and Cr concentrations in Nd,Cr : Gd3Ga5O12 single crystals grown by Czochralski method Keszei B, Paitz J, Vandlik J, Suveges A |
101 - 106 |
Crystal growth by micro-pulling-down of Ca3Ga2Ge4O14 (CGG) type-Sr3Nb1-xGa3 (+) (5/3)xSi2O14 compounds Jung IH, Yoshikawa A, Lebbou K, Fukuda T, Auh KH |
107 - 110 |
Melt growth of spessartine (Mn3Al2Si3O12) van Haren JLM, Woensdregt CF |
111 - 116 |
Growth and electrical properties of Pb(Sc1/2Nb1/2)O-3-Pb(Mg1/3Nb2/3)O-3-PbTiO3 ternary single crystals by a modified Bridgman technique Guo YP, Xu HQ, Luo HS, Xu GS, Yin ZW |
117 - 122 |
Effects of pre-anneal treatment on the optical characteristics of lead tungstate single crystal Kim DH, Yang HS, Chang KD, Park HY, Lee MB, Lee JH, Song YH, Cho YR, Lee SY |
123 - 129 |
Nitrogen doped ZnO film grown by the plasma-assisted metal-organic chemical vapor deposition Wang XQ, Yang SR, Wang JZ, Li MT, Jiang XY, Du GT, Liu X, Chang RPH |
130 - 137 |
Single crystal growth of organic semiconductors using melted anthracene as a solvent: N,N'-dimethylperylene-3,4 : 9,10-bis(dicarboximide) and phthalocyanines Miyahara T, Shimizu M |
138 - 147 |
Electrocrystallisation of metal catalysts: nucleation and growth of platinum on a titanium electrode Milchev A, Stoychev D, Lazarov V, Papoutsis A, Kokkinidis G |
148 - 157 |
Crystallization mechanism of LiNiO2 synthesized by Pechini method Lin SP, Fung KZ, Hon YM, Hon MH |
158 - 167 |
An examination of the solution phase and nucleation properties of sodium, potassium and rubidium dodecyl sulphates Smith LA, Roberts KJ, Machin D, McLeod G |
168 - 174 |
Strain-energy-driven abnormal grain growth in copper films on silicon substrates Zhang JM, Xu KW, Ji V |