X선 회절법에 의한 할로겐화 은 유제입자의 크리스탈라이트 크기 측정과 결정결함 평가에 관한 연구

배창환; 이주희; 한창석; Chang-Hwan Bae; Ju-Hee Lee; Chang-Suk Han

Korean Journal of Materials Research, Vol.19, No.6, 330-336, June, 2009

DOI10.3740/MRSK.2009.19.6.330 Export Citation

X선 회절법에 의한 할로겐화 은 유제입자의 크리스탈라이트 크기 측정과 결정결함 평가에 관한 연구

Measurement of Crystallite Size of Method and Evaluation of Crystal Defects

배창환, 이주희, 한창석^{1, †}

호서대학교 혁신기술경영융합대학원 메카트로닉스공학과
¹호서대학교 국방과학기술학과

Chang-Hwan Bae, Ju-Hee Lee, and Chang-Suk Han^{1, †}

Dept. of Mechatronics Eng., Graduate School of M. T. &M., Hoseo University, Korea
¹Dept. of Defense Science & Technology, Hoseo University, 165 Sechul-Ri, Baebang-Myun, Asan City, Chungnam 336-795, Korea

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The size of crystallites in mono-dispersed cubic silver bromide grains was measured by applying a powder X-ray diffraction method and Scherrer's equation to grains that were suspended in swollen gelatin layers. In order to evaluate the existence of defects, the measured crystallite size was compared to those measured by using a scanning electron microscope. In the case of the grains prepared by the controlled double jet method, the size of crystallites was equal to the edge length of the grains that had edge lengths smaller than 400 nm. This result proved the usefulness of the above-stated method for measuring the size of crystallites and also evaluating the presence of any crystal defect in each grain. In the case of the grains, which were precipitated in the presence of a sensitizing dye and potassium iodide, the size of crystallites was smaller than the edge’s length, indicating the discontinuities in the grains introduced during the precipitation process.

Keywords:powder X-ray diffraction;fine grain;silver halide;crystallite;crystal defect

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