도플러 넓어짐 스펙트럼을 이용한 희토류 증감지 결함 특성

이종용; 김창규; 송기영; 김재홍; C.Y. Lee; C.G. Kim; G.Y. Song; J.H. Kim

Korean Journal of Materials Research, Vol.15, No.6, 370-374, June, 2005

DOI10.3740/MRSK.2005.15.6.370 Export Citation

도플러 넓어짐 스펙트럼을 이용한 희토류 증감지 결함 특성

The Defect Characterization of Rare-earth Intensifying Screen Material by Doppler Broadening Positron Annihilation Spectrometer

이종용^†, 김창규¹, 송기영, 김재홍²

한남대학교 이과대학 물리학과
¹김천대학 방사선과
²원자력의학원 IR 및 방사성의약품개발실

C.Y. Lee^†, C.G. Kim¹, G.Y. Song, and J.H. Kim²

Department of Physics, Hannam University, Daejon, Korea
¹Radiology Department, Gimcheon College, Gimcheonsi, Korea
²Radiopharmaceuticals Lab, KIRAMS, Seoul, Korea

E-mail:

Doppler broadening spectrometer for positron annihilation experiment(DBPAS) has been used to characterize nano size defect structures in materials. DBPAS measures the concentration, spatial distribution, and size of open volume defects in the rare-earth intensifying screen materials. The screens were exposed by X-ray varying the exposed doses from 3, 6, 9, and 12 Gy with 6 W and 15 MV respectively and also irradiated by 37 MeV proton beams ranging from 0 to [Math Processing Error] . The S parameter values increased as the exposed time and the energies increased, which indicated the defects were generated more. The S parameters of the samples with X-rays varied from 0.5098 to 0.5108, on the other hand, as proton beams varied from 0.4804 to 0.4821.

Keywords:Intensifying screen;DBPAS;proton beam;X-ray;defect

[References]

Nielson B, Holland OW, Leung TC, Lynn KG, J. Appl. Phys., 74, 1636 (1993)
Ramanachalam MS, Rohatgi A, Schaffer JP, Gupta TK, J. Appl. Phys., 69, 8380 (1991)
Mantl B, Triftshauser W, Appl. Phys., 5, 177 (1974)
Molen EH, Oblak JM, Kriege OH, Met. Trans., 2, 1627 (1971)
Collins HE, Met. Trans., 5, 189 (1974)
Wesik TM, Krammer D, Lee WT, Pard AQ, Turbomachinary Intl., 1, 24 (1984)
Kim CG, Ahn CM, Song GY, Lee CY, J. Mater. Res., 12, 359 (2002)
Druzhkov AP, Yeshchenko RN, Klotsman SM, Martem' Yanov AN, Taluts GG, Phys. Met. Metall., 66, 117 (1988)
Lee JL, Waber JT, Meta. Trans., 21a, 2037 (1990)
Wei Z, Yang D, Wu KH, Seri. Meta. Meter., 29, 753 (1993)
Korean Radiation Imaging & Information Technology Researchers, Medical - Radiation Imaging & Information Technology, Komoonsa, (2002) (2002)
Chai JS, MC-50 Cyclotron Operation Annual Report, KIRAM (2003) (2003)
Gupta TK, Carlson WG, J. Mater. Sci., 20, 3487 (1987)
Pacilio M et. al., Phys. Med. Biol., 47, 107 (2002)
Uedono A, Cho Y, Tanigawa S, Ikari A, Jpn. J. Appl. Phys., 33, 1 (1994)
Kim NB, March Technical Report, KIGM&M (1994) (1994)
Gupta TK, Straub WD, Ramanachalam MS, Schaffer JP, Rohatgi A, J. Appl. Phys., 66, 6132 (1989)

[Referenced By]

[1] Nielson B, Holland OW, Leung TC, Lynn KG, J. Appl. Phys., 74, 1636 (1993)

[2] Ramanachalam MS, Rohatgi A, Schaffer JP, Gupta TK, J. Appl. Phys., 69, 8380 (1991)

[3] Mantl B, Triftshauser W, Appl. Phys., 5, 177 (1974)

[4] Molen EH, Oblak JM, Kriege OH, Met. Trans., 2, 1627 (1971)

[5] Collins HE, Met. Trans., 5, 189 (1974)

[6] Wesik TM, Krammer D, Lee WT, Pard AQ, Turbomachinary Intl., 1, 24 (1984)

[7] Kim CG, Ahn CM, Song GY, Lee CY, J. Mater. Res., 12, 359 (2002)

[8] Druzhkov AP, Yeshchenko RN, Klotsman SM, Martem' Yanov AN, Taluts GG, Phys. Met. Metall., 66, 117 (1988)

[9] Lee JL, Waber JT, Meta. Trans., 21a, 2037 (1990)

[10] Wei Z, Yang D, Wu KH, Seri. Meta. Meter., 29, 753 (1993)

[11] Korean Radiation Imaging & Information Technology Researchers, Medical - Radiation Imaging & Information Technology, Komoonsa, (2002) (2002)

[12] Chai JS, MC-50 Cyclotron Operation Annual Report, KIRAM (2003) (2003)

[13] Gupta TK, Carlson WG, J. Mater. Sci., 20, 3487 (1987)

[14] Pacilio M et. al., Phys. Med. Biol., 47, 107 (2002)

[15] Uedono A, Cho Y, Tanigawa S, Ikari A, Jpn. J. Appl. Phys., 33, 1 (1994)

[16] Kim NB, March Technical Report, KIGM&M (1994) (1994)

[17] Gupta TK, Straub WD, Ramanachalam MS, Schaffer JP, Rohatgi A, J. Appl. Phys., 66, 6132 (1989)