이온빔으로 조사된 ITO 전극 표면이 유기 EL 소자성능에 미치는 영향

오재영; 주진수; 이천안; 박병국; 김동환; Jaeyoung Oh; Jinsoo Joo; Chun An Lee; Byung Gook Park; Donghwan Kim

Korean Journal of Materials Research, Vol.13, No.3, 191-194, March, 2003

DOI10.3740/MRSK.2003.13.3.191 Export Citation

이온빔으로 조사된 ITO 전극 표면이 유기 EL 소자성능에 미치는 영향

The Influence of Surface-modified ITO by Ion Beam Irradation on the Organic EL Performances

오재영^†, 주진수¹, 이천안², 박병국², 김동환

고려대학교 신소재공학부
¹고려대학교 물리학과
²서울대학교 전기공학과

Jaeyoung Oh^†, Jinsoo Joo¹, Chun An Lee², Byung Gook Park², and Donghwan Kim

Department of Materials Science and Engineering, Korea University, Anam-Dong, Sungbuk-Ku, Seoul 136-701, Korea
¹Department of physics, Korea University, Anam-Dong, Sungbuk-Ku, Seoul 136-701, Korea
²School of Electrical Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea

E-mail:

The influence of on ion beam irradiation to the indium tin oxide (ITO) substrate on the performance of the organic light-emitting diodes (OLEDs) was studied. ITO films were used as the transparent anode of OLEDs with poly(2-methoxy-5-(2'-ethylhexyloxy)-1,4-phenylenevinylene) (MEH-PPV) as a hole-injection/transport layer. Oxygen and argon plasma treatment of ITO resulted in a change in the work function and the chemical composition. For plasma treated ITO anodes, the device efficiency clearly correlated with the value of the work function. We also discussed the implications of our experimental study in relation to the modification of the ITO surface composition, transmittance, reflectance, and water contact angle (WCA).

Keywords:ITO;surface treatment;IIR;MEH-PPV;OLED

[References]

Friend H, Gymer RW, Holmes AB, Buroughes JH, Nature, 97, 14 (1999)
Choo DJ, Talaie A, Lee YK, Jang J, Park SH, Huh G, Yoo KH, Lee JY, Thin Solid Films, 363(1-2), 37 (2000)
Bradley DDD, Synth. Met., 54, 401 (1993)
Mori K, Sakaguchi Y, Iketsu Y, Suzuki J, DISPLAYS, 22, 43 (2001)
Han Y, Kim D, Technical Report for University-Research Institute Cooperation Program, Korea Science Foundation, (2001) (2001)
Tadayyon SM, Griffiths K, Norton PR, Tripp C, J. Vac. Sci. Technol. A, 17(4) (1999)
Park Y, Choong V, Gao Y, Appl. Phys. Lett., 68(19), 2699 (1996)
Jain VK, Kulshreshtha AP, Sol. Energy Mater., 4, 151 (1981)
Heo J, Lee R, Han Y, Kim D, JSEM, the 4th Joint Seminar, Korea, 2001 (2001)
Kim H, Gilmore CM, J. Appl. Phys., 86(11), 6451 (1999)
Ishii M, Mori T, Fujikawa H, Tokito S, J. Lumines., 87, 1165 (2000)
Han Y, Kim D, to be published

[Related Articles]

[1] Friend H, Gymer RW, Holmes AB, Buroughes JH, Nature, 97, 14 (1999)

[2] Choo DJ, Talaie A, Lee YK, Jang J, Park SH, Huh G, Yoo KH, Lee JY, Thin Solid Films, 363(1-2), 37 (2000)

[3] Bradley DDD, Synth. Met., 54, 401 (1993)

[4] Mori K, Sakaguchi Y, Iketsu Y, Suzuki J, DISPLAYS, 22, 43 (2001)

[5] Han Y, Kim D, Technical Report for University-Research Institute Cooperation Program, Korea Science Foundation, (2001) (2001)

[6] Tadayyon SM, Griffiths K, Norton PR, Tripp C, J. Vac. Sci. Technol. A, 17(4) (1999)

[7] Park Y, Choong V, Gao Y, Appl. Phys. Lett., 68(19), 2699 (1996)

[8] Jain VK, Kulshreshtha AP, Sol. Energy Mater., 4, 151 (1981)

[9] Heo J, Lee R, Han Y, Kim D, JSEM, the 4th Joint Seminar, Korea, 2001 (2001)

[10] Kim H, Gilmore CM, J. Appl. Phys., 86(11), 6451 (1999)

[11] Ishii M, Mori T, Fujikawa H, Tokito S, J. Lumines., 87, 1165 (2000)

[12] Han Y, Kim D, to be published