We report on the growth of zinc-blende MnTe on (001) GaAs substrates by MBE. Layers with thickness up to 8 mu m were grown. The growth was performed for various ratios of Mn acid Te fluxes. For high values of the Te/Mn Bur ratio, Raman scattering spectra showed a presence of tellurium lines corresponding to crystalline tellurium. For low flux ratios the presence of Te precipitates was less evident. These results were confirmed by X-ray diffraction studies. The lattice parameter of cubic MnTe and its temperature dependence were determined by X-ray diffraction. From the analysis of the rocking curves, for various Bragg reflections, the fluctuations of the lattice parameter and mosaicity were separated out.