화학공학소재연구정보센터
Thin Solid Films, Vol.375, No.1-2, 159-162, 2000
Growth and characterization of oriented Pb1-xCaxTiO3 thin films
Pb1-xCaxTiO3 [PCT(x), x = 0 similar to 20 mol%] crack-free thin films with various concentration of calcium were prepared on fused quartz, Si(100) and LaAlO3(100) substrates by a sol-gel technique. The perovskite phase of PCT films was formed at approximately 500 degreesC, the films grown on fused quartz and Si(100) had a polycrystalline tetragonal structure, and the films grown on LaAiO(3)(100) substrate were highly c-axis oriented. The tetragonal factor (c/a) decreased with increasing Ca concentration. The optical transmission properties of the PCT films on fused quartz annealed at 500 degreesC for 1 h with various thicknesses were measured in the wavelength range 190-900 nm. The thin films had good optical transmissitivity. The band gaps value decreased with increasing thin films thickness.