X-Ray diffraction measurements indicate that C-60 embedded in polymethyl methacrylate have a high tendency to form crystallites, the size of which increases with C-60 concentrations. Annealing results in the growth of C-60 crystallites and for heavily doped films, rearrangement of them into a predominant (111) orientation. The samples produce intense double-peaked photoluminescence profiles centered at similar to 1.7 and similar to 2.0 eV that vary coordinately upon annealing. The results not only promise an efficient method for preparation of oriented C-60 films on substrates exhibiting strong surface energies such as Si, but also demonstrate the importance of controlling the size distribution of embedded C-60 crystallites for, e.g. obtaining desired photoluminescence.