Thin Solid Films, Vol.397, No.1-2, 138-142, 2001
Epitaxial dysprosium silicide films on silicon: growth, structure and electrical properties
Dysprosium silicide layers were grown epitaxially on Si(100) and (111). Electron microscopy results showed that DySi2-x layers grown on Si(100) have tetragonal crystalline structure and on Si(111) are hexagonal. Electrical resistivity measurements show that the two crystalline phases of DySi2-x are metallic and have slightly different electronic and magnetic properties.