Previous Article Next Article Table of Contents Journal of Materials Science Letters, Vol.20, No.4, 297-299, 2001 DOI10.1023/A:1006715727875 Export Citation Accuracy of X-ray diffraction SiC polytype-composition analyses performed by a polymorphic method Sanchez-Bajo F, Ortiz AL, Cumbrera FL Please enable JavaScript to view the comments powered by Disqus.
