The data are presented on the waveguides formation in the Nd3+-doped silicate glass and Er3+/Yb3+ co-doped phosphate glass by the implantations of He+ or Si+ ions, respectively. The prism-coupling method is used to measure the effective refractive indices of the waveguide dark modes. The refractive index profiles of the waveguides are reconstructed by using the reflectivity calculation method (RCM) and a comparison of such profiles among the different waveguides has been made. The reasons for the formation of the present waveguides are analyzed in a primary way. (C) 2002 Elsevier Science B.V. All rights reserved.