Solid-State Electronics, Vol.49, No.9, 1484-1487, 2005
Embedded EEPROM design in PD-SOI for application in an extended temperature range (-40 degrees C up to 200 degrees C)
This article describes a novel EEPROM cell, suitable for application at high-temperatures. Measurement results obtained from this cell are presented, as well as a simulation model for this cell. Furthermore, the means of memory design using this novel cell will be indicated. (c) 2005 Elsevier Ltd. All rights reserved.