Previous Article Next Article Table of Contents Solid-State Electronics, Vol.52, No.11, 1837-1837, 2008 DOI10.1016/j.sse.2008.08.004 Export Citation An analytical channel thermal noise model for deep sub-micron MOSFETs with short channel effects (vol 51, pg 1034, 2007) Jeon J, Lee JD, Park BG, Shin H Please enable JavaScript to view the comments powered by Disqus.
