화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Surface characterization of graphene based materials
Pisarek M, Holdynski M, Krawczyk M, Nowakowski R, Roguska A, Malolepszy A, Stobinski L, Jablonski A
Applied Surface Science, 388, 696, 2016
2 Surface excitation parameter for rough surfaces
Da B, Salma K, Ji H, Mao SF, Zhang GH, Wang XP, Ding ZJ
Applied Surface Science, 356, 142, 2015
3 XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure
Mahjoub MA, Monier G, Robert-Goumet C, Bideux L, Gruzza B
Applied Surface Science, 357, 1268, 2015
4 Fouling propensity and separation efficiency of epoxidated polyethersulfone incorporated cellulose acetate ultrafiltration membrane in the retention of proteins
Jayalakshmi A, Rajesh S, Mohan D
Applied Surface Science, 258(24), 9770, 2012
5 Study by EELS and EPES of the stability of InPO4/InP system
Ouerdane A, Bouslama M, Ghaffour M, Abdellaoui A, Hamaida K, Lounis Z, Monteil Y, Berrouachedi N, Ouhaibi A
Applied Surface Science, 254(22), 7394, 2008
6 Determination of the inelastic mean free paths (IMFPs) in Ti by elastic peak electron spectroscopy (EPES): Effect of impurities and surface excitations
Lesiak B, Zemek J, Jiricek P
Applied Surface Science, 252(8), 2741, 2006
7 Studies of iron and iron oxide layers by electron spectroscopes
Lesiak B, Jablonski A, Zemek J, Jiricek P, Cernansky M
Applied Surface Science, 252(2), 330, 2005
8 First stages of the InP(100) surfaces nitridation studied by AES, EELS and EPES
Petit M, Ould-Metidji Y, Robert C, Bideux L, Gruzza B, Matolin V
Applied Surface Science, 212, 601, 2003
9 Determination of the inelastic mean free path of electrons in polythiophenes using elastic peak electron spectroscopy method
Lesiak B, Kosinski A, Jablonski A, Kover L, Toth J, Varga D, Cserny I, Zagorska M, Kulszewicz-Bajer I, Gergely G
Applied Surface Science, 174(1), 70, 2001
10 Determination of the inelastic mean free path of electrons in different polyaniline samples
Lesiak B, Jablonski A, Zemek J, Trchova M, Stejskal J
Langmuir, 16(3), 1415, 2000