검색결과 : 10건
No. | Article |
---|---|
1 |
Surface characterization of graphene based materials Pisarek M, Holdynski M, Krawczyk M, Nowakowski R, Roguska A, Malolepszy A, Stobinski L, Jablonski A Applied Surface Science, 388, 696, 2016 |
2 |
Surface excitation parameter for rough surfaces Da B, Salma K, Ji H, Mao SF, Zhang GH, Wang XP, Ding ZJ Applied Surface Science, 356, 142, 2015 |
3 |
XPS combined with MM-EPES technique for in situ study of ultra thin film deposition: Application to an Au/SiO2/Si structure Mahjoub MA, Monier G, Robert-Goumet C, Bideux L, Gruzza B Applied Surface Science, 357, 1268, 2015 |
4 |
Fouling propensity and separation efficiency of epoxidated polyethersulfone incorporated cellulose acetate ultrafiltration membrane in the retention of proteins Jayalakshmi A, Rajesh S, Mohan D Applied Surface Science, 258(24), 9770, 2012 |
5 |
Study by EELS and EPES of the stability of InPO4/InP system Ouerdane A, Bouslama M, Ghaffour M, Abdellaoui A, Hamaida K, Lounis Z, Monteil Y, Berrouachedi N, Ouhaibi A Applied Surface Science, 254(22), 7394, 2008 |
6 |
Determination of the inelastic mean free paths (IMFPs) in Ti by elastic peak electron spectroscopy (EPES): Effect of impurities and surface excitations Lesiak B, Zemek J, Jiricek P Applied Surface Science, 252(8), 2741, 2006 |
7 |
Studies of iron and iron oxide layers by electron spectroscopes Lesiak B, Jablonski A, Zemek J, Jiricek P, Cernansky M Applied Surface Science, 252(2), 330, 2005 |
8 |
First stages of the InP(100) surfaces nitridation studied by AES, EELS and EPES Petit M, Ould-Metidji Y, Robert C, Bideux L, Gruzza B, Matolin V Applied Surface Science, 212, 601, 2003 |
9 |
Determination of the inelastic mean free path of electrons in polythiophenes using elastic peak electron spectroscopy method Lesiak B, Kosinski A, Jablonski A, Kover L, Toth J, Varga D, Cserny I, Zagorska M, Kulszewicz-Bajer I, Gergely G Applied Surface Science, 174(1), 70, 2001 |
10 |
Determination of the inelastic mean free path of electrons in different polyaniline samples Lesiak B, Jablonski A, Zemek J, Trchova M, Stejskal J Langmuir, 16(3), 1415, 2000 |