검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Self Focusing SIMS: Probing thin film composition in very confined volumes Franquet A, Douhard B, Melkonyan D, Favia P, Conard T, Vandervorst W Applied Surface Science, 365, 143, 2016 |
| 2 |
A novel ToF-SIMS operation mode for sub 100 nm lateral resolution: Application and performance Kubicek M, Holzlechner G, Opitz AK, Larisegger S, Hutter H, Fleig J Applied Surface Science, 289, 407, 2014 |
| 3 |
High-resolution XPS spectromicroscopy study of micro-patterned gold-tin surfaces Renault O, Garnier A, Morin J, Gambacorti N, Bertin F Applied Surface Science, 258(24), 10077, 2012 |
| 4 |
Shielding effect of double microelectrode tips in a scanning electrochemical microscope Fushimi K, Matsushita K, Hasegawa Y Electrochimica Acta, 56(26), 9602, 2011 |
| 5 |
Development of a high lateral resolution TOF-SIMS apparatus for single particle analysis Sakamoto T, Koizumi M, Kawasaki J, Yamaguchi J Applied Surface Science, 255(4), 1617, 2008 |
| 6 |
Scanned Probe Microscopies in Chemistry Hamers RJ Journal of Physical Chemistry, 100(31), 13103, 1996 |
| 7 |
Scanning Photoelectron Microscope Ninomiya K, Hasegawa M Journal of Vacuum Science & Technology A, 13(3), 1224, 1995 |