| 1 |
Transmission measurements of multilayer interference filters developed for a full integration on Complementary Metal Oxide Semiconductor chips
Masarotto L, Frey L, Charles ML, Roule A, Rodriguez G, Souil R, Morales C, Larrey V
Thin Solid Films, 631, 23, 2017 |
| 2 |
Embedding of reduced pressure-chemical vapor deposition grown Ge nanocrystals in a high quality SiO2 matrix for non-volatile memory applications
Masarotto L, Yckache K, Fanton A, Aussenac F, Fillot F
Thin Solid Films, 518(19), 5382, 2010 |
| 3 |
Reduced pressure-chemical vapor deposition of high Ge content Si/SiGe superlattices for 1.3 mu m photo-detection
Masarotto L, Hartmann JM, Bremond G, Rolland G, Papon AM, Semeria MN
Journal of Crystal Growth, 255(1-2), 8, 2003 |
| 4 |
UV scanning photoluminescence spectroscopy investigation of 6H-and 4H-SiC
Masarotto L, Bluet JM, Guillot G
Materials Science Forum, 389-3, 601, 2002 |
| 5 |
Application of UV scanning photoluminescence spectroscopy for minority carrier lifetime mapping
Masarotto L, Bluet JM, El Harrouni I, Guillot G
Materials Science Forum, 433-4, 349, 2002 |
| 6 |
Defects characterization in SiC by scanning photoluminescence spectroscopy
Masarotto L, Bluet JM, Berenguer M, Girard P, Guillot G
Materials Science Forum, 353-356, 393, 2001 |
| 7 |
Properties of nitrogen doped silicon films deposited by low-pressure chemical vapor deposition from silane and ammonia
Temple-Boyer P, Jalabert L, Masarotto L, Alay JL, Morante JR
Journal of Vacuum Science & Technology A, 18(5), 2389, 2000 |
