화학공학소재연구정보센터
검색결과 : 10건
No. Article
1 Micro-capacitors based on electrochemically grown vertical arrays of gold nanowires as electrodes
Choi DS, Park JR, Lee S, Hahn T, Presser N, Leung MS, Stupian GW, Yang EH, Khalid F
Thin Solid Films, 518(17), 5007, 2010
2 Immunogenic gangliosides in human ovarian carcinoma (vol 353, pg 251, 2007)
Ravindranath MH, Muthugounder S, Presser N, Selvan SR, Santin AD, Bellone S, Saravanan TS, Morton DL
Biochemical and Biophysical Research Communications, 377(4), 1331, 2008
3 Immunogenic gangliosides in human ovarian carcinoma
Ravindranath MH, Muthugounder S, Presser N, Selvan SR, Santin AD, Bellone S, Saravanan TS, Morton DL
Biochemical and Biophysical Research Communications, 353(2), 251, 2007
4 Focused ion beam tomography of a microelectronic device with sub-2-nm resolution
Yeoh TS, Ives NA, Presser N, Stupian GW, Leung MS, McCollum JL, Hawley FW
Journal of Vacuum Science & Technology B, 25(3), 922, 2007
5 Gangliosides of organ-confined versus metastatic androgen-receptor-negative prostate cancer
Ravindranath MH, Muthugounder S, Presser N, Selvan SR, Portoukalian J, Brosman S, Morton DL
Biochemical and Biophysical Research Communications, 324(1), 154, 2004
6 Demonstration of the Stierwalt effect caused by scatter from induced coating defects in multilayer dielectric filters
Barrie JD, Fuqua PD, Jones BL, Presser N
Thin Solid Films, 447, 1, 2004
7 Fabrication of bismuth nanowires with a silver nanocrystal shadowmask
Choi SH, Wang KL, Leung MS, Stupian GW, Presser N, Morgan BA, Robertson RE, Abraham M, King EE, Tueling MB, Chung SW, Heath JR, Cho SL, Ketterson JB
Journal of Vacuum Science & Technology A, 18(4), 1326, 2000
8 In-situ characterization of thin films by the focused ion beam
Choi SH, Li R, Pak M, Wang KL, Leung MS, Stupian GW, Presser N
Journal of Vacuum Science & Technology A, 18(4), 1701, 2000
9 Fabrication of nanometer size photoresist wire patterns with a silver nanocrystal shadowmask
Choi SH, Wang KL, Leung MS, Stupian GW, Presser N, Chung SW, Markovich G, Kim SH, Heath JR
Journal of Vacuum Science & Technology A, 17(4), 1425, 1999
10 Applications of focused ion beam machining to the characterization of carbide, nitride and oxide films
Presser N, Hilton MR
Thin Solid Films, 308-309, 369, 1997