검색결과 : 6건
| No. | Article |
|---|---|
| 1 |
Investigation of the temperature dependence of random telegraph noise fluctuations in nanoscale polysilicon-channel 3-D Flash cells Nicosia G, Goda A, Spinelli AS, Compagnoni CM Solid-State Electronics, 151, 18, 2019 |
| 2 |
Impact of the array background pattern on cycling-induced threshold-voltage instabilities in nanoscale NAND Flash memories Paolucci GM, Bertuccio M, Compagnoni CM, Beltrami S, Spinelli AS, Lacaita AL, Visconti A Solid-State Electronics, 113, 138, 2015 |
| 3 |
Effect of CF4 Plasma on Properties and Reliability of Metal-Induced Lateral Crystallization Silicon Transistors Chang CP, Wu YS Journal of the Electrochemical Society, 157(2), H192, 2010 |
| 4 |
Effect of Emitter Ledge Thickness on InGaP/GaAs Heterojunction Bipolar Transistors Chen TP, Lee CJ, Cheng SY, Lour WS, Tsai JH, Guo DF, Ku GW, Liu WC Electrochemical and Solid State Letters, 12(2), H41, 2009 |
| 5 |
Illumination-Assisted Negative Bias Temperature Instability Degradation in Low Temperature Polycrystalline Silicon Thin-Film Transistors Lin CS, Chen YC, Chang TC, Hsu WC, Chen SC, Li HW, Tu KJ, Jian FY, Chen TC Electrochemical and Solid State Letters, 12(6), H229, 2009 |
| 6 |
Resist residues and transistor gate fabrication Macintyre DS, Ignatova O, Thoms S, Thayne IG Journal of Vacuum Science & Technology B, 27(6), 2597, 2009 |