검색결과 : 9건
No. | Article |
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1 |
Magnetic, optical and electrical characterization of SiC doped with scandium during the PVT growth Racka K, Avdonin A, Sochacki M, Tymicki E, Grasza K, Jakiela R, Surma B, Dobrowolski W Journal of Crystal Growth, 413, 86, 2015 |
2 |
Temperature-dependent electrical characterization of high-voltage AlGaN/GaN-on-Si HEMTs with Schottky and ohmic drain contacts Taube A, Kaczmarski J, Kruszka R, Grochowski J, Kosiel K, Golaszewska-Malec K, Sochacki M, Jung W, Kaminska E, Piotrowska A Solid-State Electronics, 111, 12, 2015 |
3 |
Chlorine-enhanced thermal oxides growth and significant trap density reduction at SiO2/SiC interface by incorporation of phosphorus Krol K, Sochacki M, Strupinski W, Racka K, Guziewicz M, Konarski P, Misnik M, Szmidt J Thin Solid Films, 591, 86, 2015 |
4 |
Characterization of deep electron traps in 4H-SiC Junction Barrier Schottky rectifiers Gelczuk L, Dabrowska-Szata M, Sochacki M, Szmidt J Solid-State Electronics, 94, 56, 2014 |
5 |
Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures Domanowska A, Miczek M, Ucka R, Matys M, Adamowicz B, Zywicki J, Taube A, Korwin-Mikke K, Gieraltowska S, Sochacki M Applied Surface Science, 258(21), 8354, 2012 |
6 |
Influence of surface cleaning effects on properties of Schottky diodes on 4H-SiC Kwietniewski N, Sochacki M, Szmidt J, Guziewicz M, Kaminska E, Piotrowska A Applied Surface Science, 254(24), 8106, 2008 |
7 |
Properties of Pt/4H-SiC Schottky diodes with interfacial layer at elevated temperatures Sochacki M, Kolendo A, Szmidt J, Werbowy A Solid-State Electronics, 49(4), 585, 2005 |
8 |
Dielectric films fabricated in plasma as passivation of 4H-SiC Schottky diodes Sochacki M, Szmidt J Thin Solid Films, 446(1), 106, 2004 |
9 |
Deoxyribonucleoside 3 '-O-(2-thio- and 2-oxo-"spiro"-4,4-pentamethylene-1,3,2-oxathiaphospholane)s : Monomers for stereocontrolled synthesis of oligo(deoxyribonucleoside phosphorothioate)s and chimeric PS/PO oligonucleotides Stec WJ, Karwowski B, Boczkowska M, Guga P, Koziolkiewicz M, Sochacki M, Wieczorek MW, Blaszczyk J Journal of the American Chemical Society, 120(29), 7156, 1998 |