| 1 |
Total ionizing dose effects on Ag/ amorphous Bi3.15Nd0.85Ti3O12/Pt resistive switching memory
Song HJ, Yan WZ, Zhong XL, Zheng SZ, Yang SS, Xue YY, Wang GY, Guo HX, Wang JB
Materials Chemistry and Physics, 219, 340, 2018 |
| 2 |
Radiation-enhanced gate-induced-drain-leakage current in the 130 nm partially-depleted SOI pMOSFET
Peng C, Hu ZY, Ning BX, Dai LH, Bi DW, Zhang ZX
Solid-State Electronics, 106, 81, 2015 |
| 3 |
Analysis of the charged particle radiation effect for a CubeSat transiting from Earth to Mars
Yoon S, Shin Y, Jeon J, Seo Y, Jeon J, Woo J, Seon J
Current Applied Physics, 14(4), 575, 2014 |
| 4 |
Cumulative ionizing effect from solar-terrestrial charged particles and cosmic rays for CubeSats as simulated with GEANT4
Seo YM, Kim YH, Park SH, Seon J
Current Applied Physics, 12(6), 1541, 2012 |
| 5 |
Leakage currents due to radiation induced electron-hole pairs in NMOS devices
Kim HS, Hyun JW, Noh SJ
Current Applied Physics, 6(2), 185, 2006 |
| 6 |
Total ionizing dose damage in deep submicron partially depleted SOI MOSFETs induced by proton irradiation
Simoen E, Rafi JM, Mercha A, Claeys C
Solid-State Electronics, 48(6), 1045, 2004 |
