검색결과 : 10건
| No. | Article |
|---|---|
| 1 |
Vacuum field-effect transistor with a deep submicron channel fabricated by electro-forming Wang X, Shen ZH, Wu SL, Zhang JT Solid-State Electronics, 132, 1, 2017 |
| 2 |
Study of SiO2/Si interface properties of SON MOSFETs by random telegraph signal and charge pumping measurements Ferraton S, Militaru L, Souifi A, Monfray S, Skotnicki T Solid-State Electronics, 52(1), 44, 2008 |
| 3 |
An improved substrate current model for ultra-thin gate oxide MOSFETs Yang LA, Hao Y, Yu CL, Han FY Solid-State Electronics, 50(3), 489, 2006 |
| 4 |
An advanced explicit surface potential model physically accounting for the quantization effects in deep-submicron MOSFETs Pregaldiny F, Lallement C, van Langevelde R, Mathiot D Solid-State Electronics, 48(3), 427, 2004 |
| 5 |
A simple efficient model of parasitic capacitances of deep-submicron LDD MOSFETs Pregaldiny F, Lallement C, Mathiot D Solid-State Electronics, 46(12), 2191, 2002 |
| 6 |
Flicker noise in deep submicron nMOS transistors Lukyanchikova N, Garbar N, Petrichuk M, Simoen E, Claeys C Solid-State Electronics, 44(7), 1239, 2000 |
| 7 |
Modeling short channel effect on high-k and stacked-gate MOSFETs Zhang J, Yuan JS, Ma Y Solid-State Electronics, 44(11), 2089, 2000 |
| 8 |
Modeling of the body current in a Bi-MOS hybrid-mode environment Yeo KS, Seah SHL, Ma JG, Do MA Solid-State Electronics, 44(12), 2199, 2000 |
| 9 |
Material aspects of nickel silicide for ULSI applications Xu DX, Das SR, Peters CJ, Erickson LE Thin Solid Films, 326(1-2), 143, 1998 |
| 10 |
High-Aspect-Ratio Contacts - A Review of the Current Tungsten Plug Process Ireland PJ Thin Solid Films, 304(1-2), 1, 1997 |