1 - 6 |
Highly Perfect Thin-Films of SiC - X-Ray Double-Crystal Diffractometry and X-Ray Double-Crystal Topographic Study Chaudhuri J, Cheng X, Yuan C, Steckl AJ |
7 - 13 |
The Effect of Annealing on the Optical-Absorption and Electrical-Conduction of Amorphous As24.5Te71Cd4.5 Thin-Films Hafiz MM, Moharram AH, Abdelrahim MA, Abusehly AA |
14 - 19 |
Investigations on Polycrystalline Cugate2 Thin-Films Reddy MS, Reddy KT, Hussain OM, Reddy PJ |
20 - 25 |
Effect of Process Parameters on Glow-Discharge and Film Thickness Uniformity in Facing Target Sputtering Nathan SS, Muralidhar GK, Rao GM, Mohan S |
26 - 30 |
Bismuth Film Coalescence Determined by Ellipsometry Christensen TM |
31 - 39 |
Silicide Formation in Cobalt Amorphous-Silicon, Amorphous Co-Si and Bias-Induced Co-Si Films Shim JY, Park SW, Baik HK |
40 - 42 |
Fabrication of Crystalline Thin Dye Films Using an Ionized-Cluster-Beam Deposition Method Gao HJ, Xue ZQ, Pang SJ |
43 - 49 |
Numerical-Simulation of Scattering of the Molecules of Yttrium Tris(Dipivaloymethane) (Y(C11H19O2)(3)) in the Potential-Field of Crystal MgO and the Formation of a Near-Surface Layer Golovnev IF, Kalinina AP, Khokhlov OV, Belosludov RV, Igumenov IK |
50 - 54 |
Reactive Thermal Deposition of Indium Oxide and Tin-Doped Indium Oxide Thin-Films on InP Substrates Thilakan P, Kumar J |
55 - 60 |
Determination of Young Modulus by a Resonant Technique Applied to 2 Dynamically Ion Mixed Thin-Films Peraud S, Pautrot S, Villechaise P, Mazot P, Mendez J |
61 - 68 |
Microstructure of Co-Ni/Au Multilayers Studied by XRD Rafaja D, Chladek M, Valvoda V, Seddat M, Lassri H, Krishnan R |
69 - 74 |
Properties of Ws2 Thin-Films Obtained by Solid-State Reaction, Induced by Annealing, Between W-Constituents and S-Constituents Sequentially Deposited in Thin-Film Form - Influence of the Annealing Time Bernede JC, Li SJ, Pouzet J, Marie AM |
75 - 84 |
Deposition Process Study of Chromium-Oxide Thin-Films Obtained by DC Magnetron Sputtering Contoux G, Cosset F, Celerier A, Machet J |
85 - 90 |
New Method of Microphase and Chemical-Analysis as Applied to the YBaCuO Thin-Films Vasilyeva IG, Malakhov VV, Vlasov AA, Predtechensky MR |
91 - 95 |
Optical and Electrical-Properties of Metal-Diamond-Like Atomic-Scale Composite (Dlasc) Films and Dlasc/Si Heterostructures Polyakov VI, Rukovishnikov AI, Perov PI, Khomich AV, Sukhanov AA, Dorfman BF, Pypkin BN, Abraizov MG, Druz B |
96 - 102 |
Surface Modification of MgO Substrates from Aqueous Exposure - An Atomic-Force Microscopy Study Holt SA, Jones CF, Watson GS, Crossley A, Johnston C, Sofield CJ, Myhra S |
103 - 117 |
Transmission Electron-Microscopy of Al-Cu Interconnects During in-Situ Electromigration Testing Shih WC, Greer AL |
118 - 123 |
Quantitative-Analysis of Electron-Microscopic Micrographs of Multilayers Schuhrke T, Zweck J, Hoffmann H |
124 - 129 |
A Comparative-Study on the Properties of Tin Films Prepared by Chemical-Vapor-Deposition Enhanced by RF Plasma and by Electron-Cyclotron-Resonance Plasma Kim JS, Jun BH, Lee EJ, Hwang CY, Lee WJ |
130 - 134 |
Photoelectrocatalytic Hydrogen-Production from Water on Transparent Thin-Film Titania of Different Crystal-Structures and Quantum Efficiency Characteristics Ichikawa S, Doi R |
135 - 144 |
Al3O3 Thin-Film Growth on Si(100) Using Binary Reaction Sequence Chemistry Ott AW, Klaus JW, Johnson JM, George SM |
145 - 149 |
Morphology and Physical-Properties of SnO2-Based Thin-Films Deposited by the Pyrosol Process from Dibutyltindiacetate Laurent JM, Smith A, Smith DS, Bonnet JP, Clemente RR |
150 - 155 |
Incorporation and Mobility of Zinc Ions in Anodic Alumina Films Habazaki H, Zhou X, Shimizu K, Skeldon P, Thompson GE, Wood GC |
156 - 163 |
Shakedown Limits on Coated Surfaces Wong SK, Kapoor A, Williams JA |
164 - 168 |
Real-Time in-Situ Observation of Photoinduced Vapor-Deposition Polymerization of N-Vinylcarbazole with Fourier-Transform Ir Reflection-Absorption Spectroscopy Tamada M, Koshikawa H, Omichi H |
169 - 172 |
Kinetics of Lysozyme Adsorption at the Air-Buffer Interface Douillard R |
173 - 178 |
Atomic-Force Microscopy Study of Diamond-Like Atomic-Scale Composite Films Pollak FH, Dorfman B |
179 - 183 |
Low-Loss Laminated Polarization Splitters for Wavelengths Longer Than 1.3 Mu-M Prepared by Plasma-Enhanced Chemical-Vapor-Deposition Lee YG, Kawashima T, Hanaizumi O, Takahashi I, Murota J, Kawakami S |
184 - 188 |
Grain Sizes of Ni Films Measured by STM and X-Ray-Methods Wang DL, Geyer U, Schneider S, Vonminnigerode G |
189 - 191 |
Displacement Current Measurements of the Dynamic Charge-Transfer of Photosynthetic Reaction Centers in Monolayer lb Films Yasuda Y, Kawakami Y, Toyotama H |
192 - 203 |
Effects of Solvent on the Morphology and Crystalline-Structure of Lithium Phthalocyanine Thin-Films and Powders Brinkmann M, Wittmann JC, Chaumont C, Andre JJ |
204 - 212 |
Vacuum-Deposited Films of Liquid-Crystal Molecules of Cyanooctyloxybiphenyl - Electronic-Spectra of the Films and Structural Transformation of the Deposited Films as Revealed by in-Situ Fluorescence Measurements Itaya A, Watanabe K, Imamura T, Miyasaka H |
213 - 217 |
Strain and Misfit Dislocation Density in Finite Lateral Size Si1-xGex Films Grown by Selective Epitaxy Hollander B, Vescan L, Mesters S, Wickenhauser S |
218 - 226 |
Stresses in Strained Gesi Stripes and Quantum Structures - Calculation Using the Finite-Element Method and Determination Using Micro-Raman and Other Measurements Jain SC, Maes HE, Pinardi K |
227 - 231 |
Electrochemical Redox Behavior of Nickel-Iron Cyanide Film Deposited Onto Indium Tin Oxide Substrate Yamada S, Kuwabara K, Koumoto K |
232 - 235 |
Improvement of the Crystallinity of CdTe Epitaxial Film Grown on Si Substrates by Molecular-Beam Epitaxy Using the 2-Step Growth Method Han MS, Ryu YS, Song BK, Kang TW, Kim TW |
236 - 240 |
Oxidation Study of a Polycrystalline Ni/Cr Alloy .4. 400 Degrees-C Anneal in Air Epling WS, Hoflund GB |
241 - 246 |
Zirconia Coatings Realized by Microwave Plasma-Enhanced Chemical-Vapor-Deposition Bertrand G, Mevrel R |
247 - 254 |
In-Situ Tensile-Strength Measurement and Weibull Analysis of Thick-Film and Thin-Film Micromachined Polysilicon Structures Greek S, Ericson F, Johansson S, Schweitz JA |
255 - 259 |
An Integrated Optical Method for Measuring the Thickness and Refractive-Index of Birefringent Thin-Films Caliendo C, Verona E, Saggio G |
260 - 263 |
Thermionic Emission Obtained by Thermal Annealing in Vertical Polysilicon-Monosilicon Junctions Idrissi M, Benzohra M |
264 - 269 |
The Importance of the Pd to Sn Ratio and of Annealing Cycles on the Performance of Pd/Sn Ohmic Contacts to N-GaAs Islam MS, Mcnally PJ, Cameron DC, Herbert PA |
270 - 276 |
Investigation of the Stoichiometry of MBE-Grown Fe3O4 Layers by Magnetooptical Kerr Spectroscopy Fontijn WF, Wolf RM, Metselaar R, Vanderzaag PJ |
277 - 281 |
On the Enlargement of the Lattice-Parameter-C in Sputter-Deposited in-Situ Prepared Thin-Films of YBa2Cu3Ox Aswal DK, Gupta SK, Narang SN, Sabharwal SC, Gupta MK |
282 - 289 |
Bioactive Nanostructure with Glutamate-Dehydrogenase Associated with lb Films - Protecting Role of the Enzyme Molecules on the Structural Lipidic Organization Girardegrot AP, Morelis RM, Coulet PR |
290 - 292 |
Characteristics of Ni/N-Aginse2 Polycrystalline Thin-Film Schottky-Barrier Diodes Ramesh PP, Uthanna S, Naidu BS, Reddy PJ |
293 - 298 |
Electrical-Properties of Doped Polypyrrole/Silicon Heterojunction Diodes and Their Response to NOx Gas Tuyen LT, Potjekamloth K, Liess HD |
299 - 302 |
SnO2 Thin-Films Prepared by the Sol-Gel Process Racheva TM, Critchlow GW |
303 - 306 |
Effect of Growth Temperature on the Orientation of CdTe on GaAs Prepared by Molecular-Beam Epitaxy Yin JJ, Huang Q, Zhou JM, Yin JG |
307 - 312 |
TEM Study of Silicide Islands Formation in Reactions of Thin-Films of Metallic Glasses with Si Substrates Rozhanskii NV, Lifshits VO |
313 - 317 |
High-Resolution Transmission Electron-Microscopy Study of Pulsed-Laser Beam Crystallized Si Thin-Film - The Formation of Hexagonal Si and Defects Kim JH, Lee JY |
318 - 323 |
Study of Nitrogen Pressure Effect on the Laser-Deposited Amorphous-Carbon Films Bulir J, Jelinek M, Vorlicek V, Zemek J, Perina V |
324 - 329 |
Experimental and Theoretical-Study of Step Coverage in Metal-Organic Chemical-Vapor-Deposition of Tantalum Oxide Thin-Films Yun JH, Rhee SW |
330 - 332 |
In-Situ Investigation of Partially Deuterated Fatty-Acid and Phospholipid Monolayers at the Air-Water-Interface by Ir Reflection-Absorption Spectroscopy (Vol 284, Pg 428, 1996) Gericke A, Brauner JW, Erukulla RK, Bittman R, Mendelsohn R |
333 - 333 |
Determination of the Thickness and Optical-Constants of Thin-Films from Transmission Spectra (Vol 286, Pg VI, 1996) Kubinyi M, Benko N, Grofcsik A, Jones WJ |