XI - XII |
2007 ICMCTF - Preface Pauleau Y, Stewart A, Erdernir A, Mayrhofer P, Inspektor A |
107 - 113 |
Production scale deposition of multilayer film structures for birefringent optical components Tilsch MK, Hendrix K, Tan K, Shemo D, Bradley R, Erz R, Buth J |
114 - 118 |
Effect of substrate temperature on the properties of carbon-coated optical fibers prepared by plasma enhanced chemical vapor deposition Lin HC, Shiue ST, Chou YM, Lin HY, Wu TC |
119 - 127 |
Ellipsometer analysis in the n-k plane Barton D, Urban FK |
128 - 135 |
Loading rate effects on the fracture behaviour of solar control coatings during nanoindentation Chen J, Bull SJ |
136 - 140 |
Near-interfacial delamination failures observed in ion-beam-sputtered Ta2O5/SiO2 multi-layer stacks Grigonis M, Hebenstreit W, Tilsch MK |
141 - 146 |
Structure and properties of reactively-sputtered AlxCoCrCuFeNi oxide films Chen TK, Wong MS |
147 - 154 |
Transparent conducting oxide films for thin film silicon photovoltaics Beyer W, Hupkes J, Stiebig H |
155 - 158 |
Structural and optical properties of Al-doped ZnO nanowires synthesized by hydrothermal method Bai SN, Tsai HH, Tseng TY |
159 - 164 |
Optical properties of ZnO films grown by atmospheric-pressure chemical vapor deposition using Zn and H2O as source materials Terasako T, Yagi M, Ishizaki M, Senda Y, Matsuura H, Shirakata S |
165 - 169 |
Electroluminescence of zinc oxide thin-films prepared via polymeric precursor and via sol-gel methods Lima SAM, Cremona M, Davolos MR, Legnani C, Quirino WG |
170 - 174 |
Optical characterizations of complete TFT-LCD display devices by phase modulated spectroscopic ellipsometry Gaillet M, Yan L, Teboul E |
175 - 178 |
Studies on electrochromic smart windows based on titanium doped WO3 thin films Karuppasamy A, Subrahmanyam A |
179 - 182 |
Structural and transport properties of amorphous Se-Sb-Ag chalcogenide alloys and thin films Bindra KS, Suri N, Kamboj MS, Thangaraj R |
183 - 188 |
Domain reversal of periodically poled LiNbO3 with a shorter domain inverted period Kwon SW, Yang WS, Lee HM, Kim WK, Lee HY, Song YS, Park MH, Yoon DH, Kim BY, Cho NI, Lee DY |
189 - 192 |
Photo-induced hydrophilicity of TiO2-N-x(x) thin films on PET plates Chou HY, Lee EK, You JW, Yu SS |
193 - 197 |
Indium tin oxide films prepared via wet chemical route Legnani C, Lima SAM, Oliveira HHS, Quirino WG, Machado R, Santos RMB, Davolos MR, Achete CA, Cremona M |
198 - 202 |
Study of Ag nanoparticles incorporated SnO2 transparent conducting films by photochemical metal-organic deposition Kim H, Wang SJ, Park HH, Chang HJ, Jeon H, Hill RH |
203 - 207 |
Transparent conducting GZO, Pt/GZO, and GZO/Pt/GZO thin films Cheng CH, Ting JM |
208 - 211 |
The properties of ZnO/Cu/ZnO multilayer films before and after annealing in the different atmosphere Sahu DR, Huang JL |
212 - 215 |
Application of mesoporous TiO2 as a thermal isolation layer for infrared sensors Choi SG, Ha TJ, Yu BG, Shin S, Cho HH, Park HH |
216 - 222 |
Deposition of thick cubic boron nitride films - Mechanisms and concepts Kulisch W, Freudenstein R |
223 - 227 |
Investigation of wurtzite (B,Al)N films prepared on polycrystalline diamond Song JH, Huang JL, Lu HH, Sung JC |
228 - 232 |
Plasma processing in carbon containing atmosphere for possible treatment of wind turbine components Zlatanovic M, Popovic N, Mitric M |
233 - 237 |
Double-crystal x-ray topography of freestanding HVPE grown n-type GaN Mahadik NA, Qadri SB, Rao MV |
238 - 242 |
GaN nanowires - influence of the starting material on nanowire growth Djurisic AB, Tam KH, Hsu YF, Zhang SL, Xie MH, Chan WK |
243 - 247 |
Characterization of diamond-like carbon coatings prepared by pulsed bias cathodic vacuum arc deposition Wu JB, Chang JJ, Li MY, Leu MS, Li AK |
248 - 251 |
Structure and mechanical properties of Ag-incorporated DLC films prepared by a hybrid ion beam deposition system Choi HW, Choi JH, Lee KR, Ahn JP, Oh KH |
252 - 256 |
Comparative studies on influence of acetylene to argon flow rate ratios on nano-scratch behavior of a-C : H films produced on steel substrates by plasma immersion ion implantation and deposition Xu M, Cai X, Zhao J, Chen QL, Chu PK |
257 - 261 |
Electrical conduction mechanism in laser deposited amorphous carbon Miyajima Y, Shannon JM, Henley SJ, Stolejan V, Cox DC, Silva SRP |
262 - 266 |
Low-friction diamond-like carbon (DLC)-layers for humid environment Tillmann W, Vogli E, Hoffmann F |
267 - 271 |
Deformation behaviour of DLC coatings on (111) silicon substrates Haq AJ, Munroe PR, Hoffman M, Martin PJ, Bendavid A |
272 - 276 |
DLC film properties obtained by a low cost and modified pulsed-DC discharge Trava-Airoldi VJ, Bonetti LF, Capote G, Fernandes JA, Blando E, Hubler R, Radi PA, Santos LV, Corat EJ |
277 - 283 |
Influence of CO2 and N-2 on the growth of carbon nanotubes by using thermal chemical vapor deposition Chen M, Kao YC, Yu HW, Lu SC, Koo HS |
284 - 292 |
Bioaffinity platforms based on carbon-polymer biocomposites for electrochemical biosensing Pividori MI, Lenno A, Zacco E, Hernandez S, Fabiano S, Alegret S |
293 - 298 |
Characterization of hydrogen-free diamond-like carbon film on COC for flexible organic electro-luminescence application Wang DY, Chen FK, Wang NH, Yu HH |
299 - 303 |
Depth profiling of fluorine-doped diamond-like carbon (F-DLC) film: Localized fluorine in the top-most thin layer can enhance the non-thrombogenic properties of F-DLC Hasebe T, Nagashima S, Kamijo A, Yoshimura T, Ishimaru T, Yoshimoto Y, Yohena S, Kodama H, Hotta A, Takahashi K, Suzuki T |
304 - 309 |
Field emission properties of carbon nanotubes grown on a conical tungsten tip for the application of a microfocus x-ray tube Park CK, Kim JP, Yun SJ, Lee SH, Park JS |
310 - 315 |
Characterization of organic monolayers on the surface of aluminum in the process of thermal treatment Hirani N, Chvedov D, Jones R |
316 - 319 |
SAXS analysis of graphitic amorphous carbon Oliveira MH, Barbieri PF, Torriani IL, Marques FC |
320 - 324 |
Characterization and modelling of the elastic properties of nano-structured W/Cu multilayers Castelnau O, Geandier G, Renault PO, Goudeau P, Le Bourhis E |
325 - 335 |
FIB and TEM studies of damage mechanisms in DLC coatings sliding against aluminum Meng-Burany X, Alpas AT |
336 - 339 |
Microstructure and mechanical properties of B4C films deposited by ion beam sputtering Zhou MJ, Wong SF, Ong CW, Li Q |
340 - 344 |
Characteristics of low-k SiOC(-H) films deposited at various substrate temperature by PECVD using DMDMS/O-2 precursor Kim CY, Kim SH, Navarnathavan R, Choi CK, Jeung WY |
345 - 348 |
Evaluation of Poisson's ratio and Young's modulus of nitride films by combining grazing incidence X-ray diffraction and laser curvature techniques Chen HY, Chen JH, Lu FH |
349 - 354 |
Fourier transform infrared reflection absorption spectroscopy and microspectroscopy, a tool to investigate thermally grown oxide scales Lefez B, Lopitaux J, Hannoyer B, Bacos MP, Beucher E |
355 - 359 |
The effect on the microstructures of electroless nickel coatings initiated by pulsating electric current Lin CK, Hsu HT, Chen CT, Yang TJ |
360 - 363 |
Nickel silicide nanocrystals embedded in SiO2 and HfO2 for nonvolatile memory application Yang FM, Chang TC, Liu PT, Yeh YH, Yu YC, Lin JY, Sze SM, Lou JC |
364 - 368 |
Preparation of BaZrO3 films by physical vapor deposition and a novel hydrothermal duplex technique Teng HP, Chieh YC, Lu FH |
369 - 373 |
Experimental studies on epitaxially grown TiN and VN films Kutschej K, Rashkova B, Shen J, Edwards D, Mitterer C, Dehm G |
374 - 377 |
Investigation of the low dielectric siloxane-based hydrogen silsesquioxane (HSQ) as passivation layer on TFT-LCD Chang TS, Chang TC, Liu PT, Tsao SW, Yeh FS |
378 - 382 |
Oxygen-adsorption characterization of activated non-evaporable Ti-Zr-V getter films by synchrotron radiation photoemission spectroscopy Li CC, Huang JL, Lin RJ, Lii DF, Chen CH |
383 - 387 |
Alternating current measurements of thermally evaporated triclinic lead phthalocyanine thin films Shafai TS, Gould RD |
388 - 396 |
Structural and textural analyses of SiC-based and carbon CVD coatings by Raman Microspectroscopy Chollon G |
397 - 401 |
Transmission electron microscopy and X-ray diffraction analysis of alumina coating by alternate-current inverted magnetron-sputtering technique Aryasomayajula A, Canovic S, Bhat D, Gordon MH, Halvarsson A |
402 - 406 |
Stable resistive switching behaviors of sputter deposited V-doped SrZrO3 thin films Lin CC, Yu JS, Lin CY, Lin CH, Tseng TY |
407 - 411 |
Hydrogen sensing characteristics of an electrodeposited WO3 thin film gasochromic sensor activated by Pt catalyst Hsu WC, Chan CC, Peng CH, Chang CC |
412 - 416 |
Capacitance-voltage characteristics of MOS capacitors with Ge nanocrystals embedded in ZrO2 gate material Lee HR, Choi S, Cho K, Kim S |
417 - 421 |
The effect of combined shot-peening and PEO treatment on the corrosion performance of 2024 Al alloy Asquith DT, Yerokhin AL, Yates JR, Matthews A |
422 - 427 |
Corrosion behavior of AZ91 magnesium alloy treated by plasma immersion ion implantation and deposition in artificial physiological fluids Liu CL, Xin YC, Tian XB, Chu PK |
428 - 432 |
Impedance spectroscopy characterisation of PEO process and coatings on aluminium Parfenov EV, Yerokhin AL, Matthews A |
433 - 437 |
Surface patterning by nanosphere lithography for layer growth with ordered pores Zhou CM, Gall D |
438 - 443 |
The effect of deposition temperature on the structure and electrical properties of low-k film using Diethoxymethylsilane (DEMS) prepared by plasma enhanced chemical vapor deposition Cheng YL, We BJ, O'Neill ML, Karwacki EJ |
444 - 448 |
Memory effect of RF sputtered ZrO2 thin films Lin CY, Wu CY, Wu CY, Lin CC, Tseng TY |
449 - 453 |
Resistance characterization of Cu stress-induced void migration at narrow metal finger connected with wide lead Wang RCJ, Chang-Liao KS, Wang TK, Lee CC, Lin JH, Oates AS, Lee SC, Wu K |
454 - 459 |
Thickness-dependent microstructures and electrical properties of CaCu3Ti4O12 films derived from sol-gel process Chang LC, Lee DY, Ho CC, Chiou BS |
460 - 464 |
Excessive oxygen evolution during plasma electrolytic oxidation of aluminium Snizhko LO, Yerokhin AL, Gurevina NL, Patalakha VA, Matthews A |
465 - 469 |
Electron scattering at single crystal Cu surfaces Purswani JM, Gall D |
470 - 474 |
Source-drain barrier height engineering for suppressing the a-Si : H TFTs photo leakage current Wang MC, Chang TC, Liu PT, Li YY, Huang FS, Mei YJ, Chen JR |
475 - 480 |
Relationships between material properties of piezo-electric thin films and device characteristics of film bulk acoustic resonators Lee JB, Cho DH, Kim DY, Park CK, Park JS |
481 - 485 |
Optical refractive index and static permittivity of mixed Zr-Si oxide thin films prepared by ion beam induced CVD Ferrer FJ, Frutos F, Garcia-Lopez J, Gonzalez-Elipe AR, Yubero F |