화학공학소재연구정보센터

Electrochemical and Solid State Letters

Electrochemical and Solid State Letters, Vol.4, No.3 Entire volume, number list
ISSN: 1099-0062 (Print) 

In this Issue (14 articles)

E9 - E12 Oxygen reduction on teflon bonded Pt/WO3/C electrode in sulfuric acid
Sun Z, Chiu HC, Tseung ACC
H1 - H3 Hydroxyl groups on boron-doped diamond electrodes and their modification with a silane coupling agent
Notsu H, Fukazawa T, Tatsuma T, Tryk DA, Fujishima A
L1 - L1 Comment on "Effect of dissolved iron on oxygen reduction at a Pt/C electrode in sulfuric acid"
Ye S
L2 - L2 Response to "Comment on'Effect of dissolved iron on oxygen reduction at a Pt/C electrode in sulfuric acid' "
Sun Z, Tseung ACC
L3 - L3 LiBOB and its derivatives weakly coordinating anions, and the exceptional conductivity of their nonaqueous solutions (vol 4, pg E1, 2001)
Xu W, Angell CA
A19 - A22 Expansion of active site area and improvement of kinetic reversibility in electrochemical pseudocapacitor electrode
Lee HY, Kim SW, Lee HY
A23 - A26 Ceria-supported platinum as hydrogen-oxygen recombinant catalyst for sealed lead-acid batteries
Hariprakash B, Bera P, Martha SK, Gaffoor SA, Hegde MS, Shukla AK
A27 - A29 Enhancement of reversible hydrogen capacity into activated carbon through water electrolysis
Jurewicz K, Frackowiak E, Beguin F
B11 - B13 Enhanced passivation of the oxide/SiGe interface of SiGe epitaxial layers on Si by anodic oxidation
Rappich J, Sieber I, Knippelmeyer R
E13 - E15 Mixed electronic-oxide ionic conductor of Fe-doped La(Sr)GaO3 perovskite oxide for oxygen permeating membrane
Tsuruta Y, Todaka T, Nisiguchi H, Ishihara T, Takita Y
G23 - G25 Epitaxial growth with monosilane gas on a 400 mm diameter silicon wafer
Imai M, Nakahara S, Inoue K, Mayusumi M, Gima S
G26 - G27 Implantation induced selective chemical etching of indium phosphide
Simpson TW, Gallivan PA, Mitchell IV
G28 - G30 Investigation of deep submicron single and double gate SOI MOSFETs in accumulation mode for enhanced performance
Rauly E, Iniguez B, Flandre D
G31 - G34 Oxygen plasma resistance of low-k organosilica glass films
Furusawa T, Ryuzaki D, Yoneyama R, Homma Y, Hinode K