Polarization behavior of polyvinylidene fluoride films with the addition of reduced graphene oxide

Junwoo Lee; Sangwoo Lim

Journal of Industrial and Engineering Chemistry, Vol.67, 478-485, November, 2018

DOI10.1016/j.jiec.2018.07.022 Export Citation

Polarization behavior of polyvinylidene fluoride films with the addition of reduced graphene oxide

Junwoo Lee, and Sangwoo Lim^†

Department of Chemical and Biomolecular Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 03722, Republic of Korea

E-mail:

The effect of reduced graphene oxide (RGO) addition on the dielectric and piezoelectric behavior of the polyvinylidene fluoride (PVDF) films was studied. Dielectric constant increased by four times and piezoelectric coefficient also increased twice by the addition of RGO in the PVDF films. Based on capacitance.voltage and ellipsometry measurements and the Kramers.Kronig transformation, it is concluded that the enhanced dielectric and piezoelectric properties of the PVDF/RGO films resulted from the increased orientational polarization due to a phase transition from nonpolar crystalline α phase to polar crystalline β phase in the PVDF structure.

Keywords:Polyvinylidene fluoride;Reduced graphene oxide;Dielectric constant;Polarization

[References]

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[2] Yun S, Wang X, Mater. Lett., 60 (2211)

[3] Barber P, Balasubramanian S, Anguchamy Y, Gong S, Wibowo A, Gao H, Ploehn HJ, zur Loye HC, Materials, 2, 1697 (2009)

[4] Yun S, Wang X, Li B, Xu D, Solid State Commun., 143, 461 (2007)

[5] Yun S, Shi J, Qian X, Mater. Chem. Phys., 113, 487 (2012)

[6] Yun S, Wang X, J. Electroceram., 21, 585 (2008)

[7] Lee SG, Ha JW, Sohn EH, Park IJ, Lee SB, Appl. Surf. Sci., 390, 339 (2016)

[8] Yun S, Wang X, Shi J, Xu D, J. Alloy. Compd., 485, 610 (2009)

[9] Shi J, Cui N, Wang X, Yun S, Phys. Status Solidi B Basic Solid State Phys., 254, 170001 (2017)

[10] Hassan MM, Khan W, Azam A, Naqvi AH, J. Ind. Eng. Chem., 21, 283 (2015)

[11] Yun SN, Wang XL, Li JF, Shi J, Xu DL, Mater. Chem. Phys., 116(2-3), 339 (2009)

[12] Oh E, Seo D, Kim S, Lee KY, Kim SW, Lim S, Sci. Adv. Mater., 8, 817 (2016)

[13] Batra AK, Bandyopadhyay A, Chilvery AK, Thomas M, Energy Sci. Technol., 5, 1 (2013)

[14] Ducrot PH, Dufour I, Ayela C, Sci. Rep., 6, 19426 (2016)

[15] Kang SJ, Park YJ, Bae I, Kim KJ, Kim HC, Bauer S, Thomas EL, Park C, Adv. Funct. Mater., 19(17), 2812 (2009)

[16] Lee KH, Lee G, Lee K, Oh MS, Im S, Yoon SM, Adv. Mater., 21(42), 4287 (2009)

[17] Yaqoob U, Uddin ASMI, Chung GS, Appl. Surf. Sci., 405, 420 (2017)

[18] Fu J, Hou Y, Zheng M, Wei Q, Zhu M, Yan H, ACS Appl. Mater. Interfaces, 7, 24480 (2015)

[19] Silibin MV, Bystrov VS, Karpinsky DV, Nasani N, Goncalves G, Gavrilin IM, Solnyshkin AV, Marques PAAP, Singh B, Bdikin IK, Appl. Surf. Sci., 421, 42 (2017)

[20] Kisiel A, Konieczny M, Zabska M, IOP Conf. Sci. Eng., 113, 012002 (2016)

[21] Fan P, Wang L, Yang J, Chen F, Zhong M, Nanotechnology, 23, 365702 (2012)

[22] Chanmal C, Deo M, Jog J, Appl. Surf. Sci., 258(3), 1256 (2011)

[23] Thomas P, Varughese KT, Dwarakanath K, Varma KBR, Compos. Sci. Technol., 70, 539 (2010)

[24] Young KF, Frederikse HPR, J. Phys. Chem. Ref Data, 2, 313 (1973)

[25] Zhang L, Cheng ZY, J. Adv. Dielect., 1, 389 (2011)

[26] Tong W, Zhang Y, Yu L, Luan X, Zhang Q, Lv F, Chu PK, Shen B, Zhang Z, J. Phys. Chem. C, 118, 10567 (2014)

[27] Dang ZM, Wang L, Yin Y, Zhang Q, Lei QQ, Adv. Mater., 19(6), 852 (2007)

[28] Dang ZM, Fan LZ, Shen Y, Nan CW, Chem. Phys. Lett., 369(1-2), 95 (2003)

[29] Yang W, Yu S, Sun R, Du R, Acta. Mater., 59, 5593 (2011)

[30] Dang ZM, Fan LZ, Shen Y, Nan CW, Mater. Sci. Eng. B-Solid State Mater. Adv. Technol., 103, 140 (2003)

[31] Dang ZM, Wang HY, Zhang YH, Qi JQ, Macromol. Rapid Commun., 26(14), 1185 (2005)

[32] Raju GG, Dielectrics in electric fields, second ed., CRC press, New York, 2016.

[33] Lim SW, Shimogaki Y, Nakano Y, Tada K, Komiyama H, J. Electrochem. Soc., 144(7), 2531 (1997)

[34] Priya S, J. Electroceram, 9, 165 (2007)

[35] Shirinov AV, Schomburg WK, Sens. Actuators A-Phys., 142, 48 (2008)

[36] Arshak KI, McDonagh D, Durcan MA, Sens. Actuators A-Phys., 79, 102 (2000)

[37] Foster FS, Harasiewicz KA, Sherar MD, IEEE Trans. Ultrason. Ferroelect. Freq. Control, 47, 1363 (2000)

[38] Zhou X, Chu B, Neese B, Lin M, Zhang QM, IEEE Trans. Dielectr. Electr. Insul., 14, 1133 (2007)

[39] Koga K, Ohigashi H, J. Appl. Phys., 59, 2142 (1986)

[40] Kao KC, Dielectric phenomena in solids: with emphasis on physical concepts of electronic processes, first ed., Elsevier Academic Press, London, 2004.

[41] Liu A, Zhu H, Sun H, Xu Y, Noh YY, Adv. Mater., 1706364 (2018).

[42] Kim JY, Hwang MS, Kim YH, Kim HJ, Lee Y, J. Appl. Phys., 90, 2469 (2001)

[43] Lim SW, Shimogaki Y, Nakano Y, Tada K, Komiyama H, Jpn. J. Appl. Phys., 35, 1468 (1996)

[44] Li Y, Xu JZ, Zhu L, Xu H, Pan MW, Zhong GJ, Li ZM, Polymer, 55, 4765 (2014)

[45] Mandal D, Henkel K, Schmeisser D, J. Phys. Chem. B, 115(35), 10567 (2011)

[46] Bormashenko Y, Pogreb R, Stanevsky O, Bormashenko E, Polym. Test, 23, 791 (2004)

[47] Lovinger AJ, Science, 220, 1115 (1983)

[48] Li Q, Wang Q, Macromol. Chem. Phys., 217, 1228 (2016)

[49] Fogarassy E, Geohegan D, Stuke M, Laser ablation North-Holland, Amsterdam, (2012).

[50] Onsager L, J. Am. Chem, Soc., 58, 1486 (1936)

[51] Polo SR, Wilson MK, J. Chem. Phys., 23, 2376 (1955)

[52] Mopsik FI, Broadhurst MG, J. Appl. Phys., 46, 4204 (1975)

[53] Frohlich H, Sack R, Proc. R. Soc. London Ser. A-Math. Phys. Eng. Sci., 182, 388 (1944)

[54] Meng X, Yao P, Xu Y, Meng H, Zhang X, RSC Adv., 6, 61920 (2016)