화학공학소재연구정보센터
검색결과 : 8건
No. Article
1 DC Current-crowding estimation for SiGe:C heterojunction bipolar transistors
Ramirez-Garcia E, Garduno-Nolasco E, Rodriguez-Mendez LM, Diaz-Albarran LM, Valdez-Perez D, Galaz-Larios MC, Aniel F, Zerounian N, Enciso-Aguilar MA
Solid-State Electronics, 153, 1, 2019
2 Monte Carlo modelling of Schottky diode for rectenna simulation
Bernuchon E, Aniel F, Zerounian N, Grimault-Jacquin AS
Solid-State Electronics, 135, 71, 2017
3 SiGe:C HBT transit time analysis based on hydrodynamic modeling using doping, composition and strained dependent SiGe:C carriers mobility and relaxation time
Ramirez-Garcia E, Michaillat M, Aniel F, Zerounian N, Enciso-Aguilar M, Rideau D
Solid-State Electronics, 61(1), 58, 2011
4 Parasitic electrostatic capacitance of high-speed SiGe Heterojunction Bipolar Transistors
Zerounian N, Aniel F, Barbalat B, Chevalier P, Chantre A
Solid-State Electronics, 53(5), 483, 2009
5 Modelling and measurements of the parasitic electrostatic capacitances in Si/SiGe n-HFET
Zerounian N, Enciso-Aguilar M, Hackbarth T, Herzog HJ, Aniel F
Solid-State Electronics, 51(3), 449, 2007
6 Microwave performances of silicon heterostructure-FETs
Aniel F, Enciso M, Richard S, Giguerre L, Zerounian N, Crozat P, Adde R, Hackbarth T, Herzog JH, Konig U
Applied Surface Science, 224(1-4), 370, 2004
7 Strained Si HFETs for microwave applications: state-of-the-art and further approaches
Aguilar ME, Rodriguez M, Zerounian N, Aniel F, Hackbarth T, Herzog HJ, Konig U, Mantl S, Hollander B, Chrastina D, Isella G, von Kanel H, Lyutovich K
Solid-State Electronics, 48(8), 1443, 2004
8 Transit times of SiGe : C HBTs using nonselective base epitaxy
Zerounian N, Rodriguez M, Enciso M, Aniel F, Chevalier P, Martinet B, Chantre A
Solid-State Electronics, 48(10-11), 1993, 2004