1 - 6 |
Room-Temperature Reduction of Merie-Like Plasma-Induced Interface States Atanassova E |
7 - 11 |
Characterization of IrO2 Thin-Films by Raman-Spectroscopy Liao PC, Chen CS, Ho WS, Huang YS, Tiong KK |
12 - 16 |
Ellipsometric Characterization of an AISI-304 Stainless-Steel Protective Coating Fuentesgallego JJ, Blanco E, Esquivias L |
17 - 22 |
Electrical and Structural Characteristics of Chromium Thin-Films Deposited on Glass and Alumina Substrates Kulkarni AK, Chang LC |
23 - 27 |
Morphology and Microstructure of Polypyrrole Formed by Electrochemical Polymerization Shan JN, Yuan CW, Zhang HQ |
28 - 34 |
In-Situ Reflection High-Energy Electron-Bombardment Analysis of Biaxially Oriented Yttria-Stabilized Zirconia Thin-Film Growth on Amorphous Substrates Betz V, Holzapfel B, Schultz L |
35 - 44 |
Low-Temperature Zirconia Thin-Film Synthesis by a Chemical-Vapor-Deposition Process Involving Zrcl4 and O-2-H-2-Ar Microwave Postdischarges - Comparison with a Conventional CVD Hydrolysis Process Gavillet J, Belmonte T, Hertz D, Michel H |
45 - 54 |
Analysis of Thin-Film Stress Measurement Techniques Malhotra SG, Rek ZU, Yalisove SM, Bilello JC |
55 - 61 |
Depth-Sensitive Strain Analysis of a W-Ta-W Trilayer Malhotra SG, Rek Z, Yalisove SM, Bilello JC |
62 - 64 |
Monitoring the Deposition of Cu Thin-Film Using the Double-Exposure Holographic-Interferometry Technique Dongre MB, Fulari VJ, Kulkarni HR |
65 - 70 |
Deposition of Cubic Boron-Nitride Layers - Characterization of Substrate-Layer Interface Barth KL, Sigle W, Stockle D, Ulmer J, Lunk A |
71 - 76 |
Synthesis of Tungsten Carbide Thin-Films by Reactive Pulsed-Laser Deposition Chitica N, Gyorgy E, Lita A, Marin G, Mihailescu IN, Pantelica D, Petrascu M, Hatziapostolou A, Grivas C, Broll N, Cornet A, Mirica C, Andrei A |
77 - 81 |
Enhanced Diamond Nucleation on Pretreated Silicon Substrates Shen MR, Wang H, Ning ZY, Ye C, Gan ZQ, Ren ZX |
82 - 89 |
Oxygen Sensing Properties of V2O5 Cladded Optical-Glass Wave-Guide Ansari ZA, Karekar RN, Aiyer RC |
90 - 94 |
In-Situ TEM Observation of Metastable Phase Formed by Solid-State Interdiffusion in a Co-Cu System Wu P, Jiang EY, Liu YG, Wang CD |
95 - 104 |
Photoelectrolytic Micelle Disruption Method for Preparation of Free Patterns of Pigment Images Harima Y, Matsumoto K, Wang YD, Yamashita K |
105 - 114 |
TEM Characterization of Plasma-Sprayed Thermal Barrier Coatings and Ceramic-Metal Interfaces After Hot Isostatic Pressing Chen HC, Heberlein J, Pfender E |
115 - 121 |
Structural and Optical Characterization of Polycrystalline CuInSe2 Schon JH, Alberts V, Bucher E |
122 - 125 |
Photoconductivity - A Novel Method of Evaluation of Thin Semiconducting Film Thickness Pohoryles B, Morawski A |
126 - 133 |
Raman Studies of Diamond Film Growth on Fuse-Silica Substrates by a Multistep Process Lin GL, Lue JT, Chen CL, Lin IN |
134 - 141 |
Qualitative Characterization of Variation in Elastic Properties of Solid-Solutions by Acoustic Microscopy Cros B, Nounah H, Attal J |
142 - 148 |
Diffusion Barrier Properties of TaC Between Si and Cu Imahori J, Oku T, Murakami M |
149 - 153 |
Optical-Properties of Nickel Thin-Films Deposited by Electroless Plating Dumont E, Dugnoille B, Petitjean JP, Barigand M |
154 - 161 |
Dependence of the Properties of (Srxti1-X)O-3 Thin-Films Deposited by Plasma-Enhanced Metal-Organic Chemical-Vapor-Deposition on Electron-Cyclotron-Resonance Plasma Lee JS, Song HW, Jun BH, Kwack DH, Yu BG, Jiang ZT, No K |
162 - 168 |
Spontaneous Aggregation of Octaalkoxyphthalocyanine Metal-Complexes at an Air-Water-Interface Matsuzawa Y, Seki T, Ichimura K |
169 - 174 |
Interaction of Flurbiprofen Sodium with Cornea Model Monolayers at the Air-Water-Interface Garcia ML, Egea MA, Valero J, Valls O, Alsina MA |
175 - 182 |
Electropolymerization of Pyrrole and 4-(3-Pyrrolyl)Butane-Sulfonate on Pt Substrate - An in-Situ Eqcm Study Hwang BJ, Shieh DT, Chieh WC, Liaw DJ, Li LJ |
183 - 187 |
Modification of Diamond Films by High-Energy Ion Irradiation - Track Channeling and Ion Charge Fluctuation Effects Fedotov SA, Byeli AV, Zaitsev AM, Varichenko VS, Kazyutchits NM |
188 - 191 |
The Role of a Thin Amorphous-Silicon Layer in the Fabrication of Micro-Pored Silicon Kim EK, Lee MS, Choi WC, Lee HN, Min SK, Lyou J |
192 - 196 |
The Preparation, Characterization of Amorphous Cu-TCNQ Film with a Low Degree of Charge-Transfer (DCT) and Its Electric Switching Properties Sun SQ, Wu PJ, Zhu DB |
197 - 202 |
Amorphous RF-Sputtered Si100-Xnix Thin-Films with O-Less-Than-or-Equal-to-X-Less-Than-or-Equal-to-15 at.Percent - Structural, Optical and Electrical-Properties Belumarian A, Serbanescu MD, Manaila R, Stoica T, Dragomir A, Zavaliche F, Tanase M, Devenyi A |
203 - 210 |
Structure-Related Optical-Properties of Laser-Deposited Baxsr1-Xtio3 Thin-Films Grown on MgO(001) Substrates Thielsch R, Kaemmer K, Holzapfel B, Schultz L |
211 - 216 |
Magnetic and Magnetooptical Properties of (Pt/Co/Pt/Ni) Multilayers Srinivas G, Shin SC |
217 - 224 |
MgO/YBa2Cu3O7-X Multilayer Thin-Films Grown on (100)LaAlO3 by Pulsed-Laser Deposition Rao MR |
225 - 229 |
Molecular-Orientation in Liquid-Crystals on a Photochromic Polyion Complex lb Film by FTIR Spectroscopy Kawai T |
230 - 235 |
Characterization of Unintentionally or Lightly Doped Polysilicon Films by Improved Hall-Effect Measurements Lebihan F, Fortin B, Cauneau S, Briand D, Bonnaud O |
236 - 241 |
Synthesis of Multicolor Nb2O5 Coatings for Electrochromic Devices Pawlicka A, Atik M, Aegerter MA |
242 - 248 |
Anodic Corrosion of Indium Tin Oxide-Films Induced by the Electrochemical Oxidation of Chlorides Folcher G, Cachet H, Froment M, Bruneaux J |
249 - 252 |
Logarithmic Dependence of the Surface Anisotropy on the Low-Angle X-Ray-Diffraction Intensity in Co-Based Multilayers Kim JH, Shin SC |