화학공학소재연구정보센터

Thin Solid Films

Thin Solid Films, Vol.301, No.1-2 Entire volume, number list
ISSN: 0040-6090 (Print) 

In this Issue (39 articles)

1 - 6 Room-Temperature Reduction of Merie-Like Plasma-Induced Interface States
Atanassova E
7 - 11 Characterization of IrO2 Thin-Films by Raman-Spectroscopy
Liao PC, Chen CS, Ho WS, Huang YS, Tiong KK
12 - 16 Ellipsometric Characterization of an AISI-304 Stainless-Steel Protective Coating
Fuentesgallego JJ, Blanco E, Esquivias L
17 - 22 Electrical and Structural Characteristics of Chromium Thin-Films Deposited on Glass and Alumina Substrates
Kulkarni AK, Chang LC
23 - 27 Morphology and Microstructure of Polypyrrole Formed by Electrochemical Polymerization
Shan JN, Yuan CW, Zhang HQ
28 - 34 In-Situ Reflection High-Energy Electron-Bombardment Analysis of Biaxially Oriented Yttria-Stabilized Zirconia Thin-Film Growth on Amorphous Substrates
Betz V, Holzapfel B, Schultz L
35 - 44 Low-Temperature Zirconia Thin-Film Synthesis by a Chemical-Vapor-Deposition Process Involving Zrcl4 and O-2-H-2-Ar Microwave Postdischarges - Comparison with a Conventional CVD Hydrolysis Process
Gavillet J, Belmonte T, Hertz D, Michel H
45 - 54 Analysis of Thin-Film Stress Measurement Techniques
Malhotra SG, Rek ZU, Yalisove SM, Bilello JC
55 - 61 Depth-Sensitive Strain Analysis of a W-Ta-W Trilayer
Malhotra SG, Rek Z, Yalisove SM, Bilello JC
62 - 64 Monitoring the Deposition of Cu Thin-Film Using the Double-Exposure Holographic-Interferometry Technique
Dongre MB, Fulari VJ, Kulkarni HR
65 - 70 Deposition of Cubic Boron-Nitride Layers - Characterization of Substrate-Layer Interface
Barth KL, Sigle W, Stockle D, Ulmer J, Lunk A
71 - 76 Synthesis of Tungsten Carbide Thin-Films by Reactive Pulsed-Laser Deposition
Chitica N, Gyorgy E, Lita A, Marin G, Mihailescu IN, Pantelica D, Petrascu M, Hatziapostolou A, Grivas C, Broll N, Cornet A, Mirica C, Andrei A
77 - 81 Enhanced Diamond Nucleation on Pretreated Silicon Substrates
Shen MR, Wang H, Ning ZY, Ye C, Gan ZQ, Ren ZX
82 - 89 Oxygen Sensing Properties of V2O5 Cladded Optical-Glass Wave-Guide
Ansari ZA, Karekar RN, Aiyer RC
90 - 94 In-Situ TEM Observation of Metastable Phase Formed by Solid-State Interdiffusion in a Co-Cu System
Wu P, Jiang EY, Liu YG, Wang CD
95 - 104 Photoelectrolytic Micelle Disruption Method for Preparation of Free Patterns of Pigment Images
Harima Y, Matsumoto K, Wang YD, Yamashita K
105 - 114 TEM Characterization of Plasma-Sprayed Thermal Barrier Coatings and Ceramic-Metal Interfaces After Hot Isostatic Pressing
Chen HC, Heberlein J, Pfender E
115 - 121 Structural and Optical Characterization of Polycrystalline CuInSe2
Schon JH, Alberts V, Bucher E
122 - 125 Photoconductivity - A Novel Method of Evaluation of Thin Semiconducting Film Thickness
Pohoryles B, Morawski A
126 - 133 Raman Studies of Diamond Film Growth on Fuse-Silica Substrates by a Multistep Process
Lin GL, Lue JT, Chen CL, Lin IN
134 - 141 Qualitative Characterization of Variation in Elastic Properties of Solid-Solutions by Acoustic Microscopy
Cros B, Nounah H, Attal J
142 - 148 Diffusion Barrier Properties of TaC Between Si and Cu
Imahori J, Oku T, Murakami M
149 - 153 Optical-Properties of Nickel Thin-Films Deposited by Electroless Plating
Dumont E, Dugnoille B, Petitjean JP, Barigand M
154 - 161 Dependence of the Properties of (Srxti1-X)O-3 Thin-Films Deposited by Plasma-Enhanced Metal-Organic Chemical-Vapor-Deposition on Electron-Cyclotron-Resonance Plasma
Lee JS, Song HW, Jun BH, Kwack DH, Yu BG, Jiang ZT, No K
162 - 168 Spontaneous Aggregation of Octaalkoxyphthalocyanine Metal-Complexes at an Air-Water-Interface
Matsuzawa Y, Seki T, Ichimura K
169 - 174 Interaction of Flurbiprofen Sodium with Cornea Model Monolayers at the Air-Water-Interface
Garcia ML, Egea MA, Valero J, Valls O, Alsina MA
175 - 182 Electropolymerization of Pyrrole and 4-(3-Pyrrolyl)Butane-Sulfonate on Pt Substrate - An in-Situ Eqcm Study
Hwang BJ, Shieh DT, Chieh WC, Liaw DJ, Li LJ
183 - 187 Modification of Diamond Films by High-Energy Ion Irradiation - Track Channeling and Ion Charge Fluctuation Effects
Fedotov SA, Byeli AV, Zaitsev AM, Varichenko VS, Kazyutchits NM
188 - 191 The Role of a Thin Amorphous-Silicon Layer in the Fabrication of Micro-Pored Silicon
Kim EK, Lee MS, Choi WC, Lee HN, Min SK, Lyou J
192 - 196 The Preparation, Characterization of Amorphous Cu-TCNQ Film with a Low Degree of Charge-Transfer (DCT) and Its Electric Switching Properties
Sun SQ, Wu PJ, Zhu DB
197 - 202 Amorphous RF-Sputtered Si100-Xnix Thin-Films with O-Less-Than-or-Equal-to-X-Less-Than-or-Equal-to-15 at.Percent - Structural, Optical and Electrical-Properties
Belumarian A, Serbanescu MD, Manaila R, Stoica T, Dragomir A, Zavaliche F, Tanase M, Devenyi A
203 - 210 Structure-Related Optical-Properties of Laser-Deposited Baxsr1-Xtio3 Thin-Films Grown on MgO(001) Substrates
Thielsch R, Kaemmer K, Holzapfel B, Schultz L
211 - 216 Magnetic and Magnetooptical Properties of (Pt/Co/Pt/Ni) Multilayers
Srinivas G, Shin SC
217 - 224 MgO/YBa2Cu3O7-X Multilayer Thin-Films Grown on (100)LaAlO3 by Pulsed-Laser Deposition
Rao MR
225 - 229 Molecular-Orientation in Liquid-Crystals on a Photochromic Polyion Complex lb Film by FTIR Spectroscopy
Kawai T
230 - 235 Characterization of Unintentionally or Lightly Doped Polysilicon Films by Improved Hall-Effect Measurements
Lebihan F, Fortin B, Cauneau S, Briand D, Bonnaud O
236 - 241 Synthesis of Multicolor Nb2O5 Coatings for Electrochromic Devices
Pawlicka A, Atik M, Aegerter MA
242 - 248 Anodic Corrosion of Indium Tin Oxide-Films Induced by the Electrochemical Oxidation of Chlorides
Folcher G, Cachet H, Froment M, Bruneaux J
249 - 252 Logarithmic Dependence of the Surface Anisotropy on the Low-Angle X-Ray-Diffraction Intensity in Co-Based Multilayers
Kim JH, Shin SC