1 - 4 |
Hydrogen and Deuterium Migration in Annealed Plasma-Deposited Silicon-Nitride Films Savall C, Bruyere JC |
5 - 9 |
Characteristics of Pt Thin-Films on the Conducting Ceramics Tio and Ebonex (Ti4O7) as Electrode Materials Park SY, Mho SI, Chi EO, Kwon YU, Park HL |
10 - 13 |
C-13 Nuclear-Magnetic-Resonance Signals of Ge/C Films Deposited from Tetraethylgermanium in an RF Glow-Discharge Gazicki M, Potrzebowski MJ, Tyczkowski J, Schalko J |
14 - 20 |
High-Power Deposition and Analytics of Amorphous-Silicon Carbide Films Heyner R, Marx G |
21 - 25 |
Growth of Boron-Nitride Thin-Films by Metal-Organic Chemical-Vapor-Deposition Phani AR, Roy S, Rao VJ |
26 - 33 |
Thickness Variation Effects on X-Ray-Scattering of Multilayers Boufelfel A, Falco CM |
34 - 39 |
Thermal-Stability of Pulsed-Laser Deposited Diamond-Like Carbon-Films Ong CW, Zhao XA, Cheung JT, Lam SK, Liu Y, Choy CL, Chan PW |
40 - 45 |
Laser Reactive Ablation Deposition of Titanium Carbide Films Leggieri G, Luches A, Martino M, Perrone A, Majni G, Mengucci P, Mihailescu IN |
46 - 50 |
Sputter Ion Plating of Tungsten on CVD Grown Diamonds for Laser Thermal-Diffusivity Measurement Ahmed NA, Preston SD |
51 - 55 |
Structure of TiNx (0-Less-Than-X-Less-Than-1.1) Films Prepared by Iron Beam-Assisted Deposition Jiang H, Tao K, Li H |
56 - 63 |
Structures of Tantalum Pentoxide Thin-Films Formed by Reactive Sputtering of Ta Metal Chang PH, Liu HY |
64 - 66 |
Preparation of SiC Films by Solid-State Source Evaporation Fissel A, Schroter B, Krausslich J, Richter W |
67 - 74 |
Characterization of Trimethylaluminum-N2O-He Glow-Discharge in Plasma-Enhanced Chemical-Vapor-Deposition of Aluminum-Oxide Films Kim YC, Chun JS, Lee WJ |
75 - 81 |
Nanotribological Characterization of Hydrogenated Carbon-Films by Scanning Probe Microscopy Jiang ZG, Lu CJ, Bogy DB, Bhatia CS, Miyamoto T |
82 - 85 |
Low-Temperature Synthesis of Pb1-Xlax(Zr1-Ytiy)(1-X/4)O-3 Films by Pulsed-Laser Deposition Yeh MH, Liu KS, Lin IN |
86 - 90 |
Growth and Characterization of Polycrystalline InSe Thin-Films Parlak M, Ercelebi C, Gunal I, Salaeva Z, Allakhverdiev K |
91 - 103 |
Ion-Beam Sputtering of (Ta2O5)(X)-(SiO2)(1-X) Composite Thin-Films Cevro M |
104 - 109 |
Modeling of the Formation of RuO2 Thin-Film from Ru(C5H5)(2) by Metal-Organic Chemical-Vapor Decomposition Mar SY, Huang YS, Tiong KK |
110 - 114 |
X-Ray Photoelectron-Spectroscopy Characterization of Amorphous Molybdenum Oxysulfide Thin-Films Benoist L, Gonbeau D, Pfisterguillouzo G, Schmidt E, Meunier G, Levasseur A |
115 - 122 |
Whisker Growth on Sputtered Alsn (20-Wt-Percent Sn) Films Bergauer A, Bangert H, Eisenmengersittner C, Barna PB |
123 - 127 |
Microstructural Modifications in Diamond-Like Carbon Thin-Films Caused by High-Energy Ion Irradiation Barshilia HC, Sah S, Mehta BR, Vankar VD, Avasthi DK, Jaipal, Mehta GK |
128 - 131 |
In-Situ Stress Measurements of Co/Pd Multilayer Films Using an Optical Noncontact Displacement Detector Kim YS, Shin SC |
132 - 136 |
Interface Properties of A-Si-H/A-Sicx-H Superlattice Chen GH, Guo YP, Yao JH, Song ZZ, Zhang FQ |
137 - 142 |
Surface Segregation of Boron Atoms in Si and Strained Si1-xGex Layers During MBE Growth - Experiment and Simulation Kruger D, Osten HJ |
143 - 150 |
XPS and AES Characterization of Sinx-H Layers Deposited by PECVD on Parylene-C - Effects of Thermal Treatments on Parylene-C Surfaces and Parylene-C Sinx-H Interlayers Beche E, Berjoan R, Viard J, Cros B, Durand J |
151 - 158 |
Influence of Reactant Gas-Composition on Selected Properties of N-Doped Hydrogenated Amorphous-Carbon Films Wood P, Wydeven T, Tsuji O |
159 - 169 |
A Quantitative Model for the Evolution from Random Orientation to a Unique Texture in PVD Thin-Film Growth Knuyt G, Quaeyhaegens C, Dhaen J, Stals LM |
170 - 173 |
Experimental-Study of the Growth Evolution from Random Towards a (111) Preferential Orientation of PVD Tin Coatings Quaeyhaegens C, Knuyt G, Dhaen J, Stals LM |
174 - 184 |
Zirconocene-Modified Polysiloxane-2-Pyridine Coatings Sugama T, Carciello N, Rast SL |
185 - 193 |
Study and Improvement of the Adhesion of Chromium Thin-Films Deposited by Magnetron Sputtering Guilbaudmassereau V, Celerier A, Machet J |
194 - 197 |
Improving the Passivating Efficiency of Conversion Films on Stainless-Steel by Thermal-Treatment Carmezim MJ, Carvalho FG, Figueiredo MO |
198 - 204 |
Finite-Element Analysis of the Critical Ratio of Coating Thickness to Indentation Depth for Coating Property Measurements by Nanoindentation Sun Y, Bell T, Zheng S |
205 - 212 |
Adhesion and X-Ray Elastic-Constant Evaluation of Crn Coating Attar F, Johannesson T |
213 - 223 |
Optical-Properties of Thin-Films Up to 2nd-Order in the Thickness Haarmans MT, Bedeaux D |
224 - 229 |
Attenuation, Scattering, and Absorption Properties of Light-Emitting Planar Wave-Guides Schrottke L |
230 - 235 |
Rapid Thermal Processed Thin-Films of Reactively Sputtered Ta2O5 Pignolet A, Rao GM, Krupanidhi SB |
236 - 246 |
Resistance Behavior and Interdiffusion of Layered Cuni-Nicr Films Bruckner W, Schumann J, Baunack S, Pitschke W, Knuth T |
247 - 251 |
Surface-Plasmon-Enhanced Diffraction Orders in Polymer Gratings Fischer B, Rothenhausler B, Knoll W |
252 - 259 |
Oxidation Behavior of Cu-Ni(Mn) (Constantan) Films Bruckner W, Baunack S, Reiss G, Leitner G, Knuth T |
260 - 263 |
Indium Tin Oxide on InP by Pulsed-Laser Deposition Jia QX, Zheng JP, Kwok HS, Anderson WA |
264 - 267 |
Epitaxial and Thermal Strains in Oxidic Thin-Films on Si(001) Matthee T, Wecker J, Bardal A, Samwer K |
268 - 273 |
Sol-Gel-Derived Tin Oxide Thin-Films Park SS, Mackenzie JD |
274 - 278 |
Effects of Oxygen Partial-Pressure on the Microstructure and Electrical-Properties of Indium Tin Oxide Film Prepared by DC Magnetron Sputtering Choi CG, No K, Lee WJ, Kim HG, Jung SO, Lee WJ, Kim WS, Kim SJ, Yoon C |
279 - 282 |
Transient-Behavior of Thin-Film Transistors Based on Nickel Phthalocyanine Guillaud G, Benchaabane R, Jouve C, Gamoudi M |
283 - 285 |
Radiation-Damage in Indium Tin Oxide (Ito) Layers Morgan DV, Salehi A, Aliyu YH, Bunce RW, Diskett D |
286 - 291 |
Fast-Ion-Induced Fluorescence from J-Aggregate of Cyanine Dye in Langmuir-Blodgett-Films Asai K, Seki S, Sato T, Ishigure K, Shibata H |
292 - 298 |
Effects of Nitrogen Trifluoride on the Properties of Plasma-Enhanced Chemical-Vapor-Deposited Semiinsulating Polysilicon Films Ranade RM, Ang SS, Brown WD |
299 - 304 |
The Effect of a MgO Seed Layer on the Biepitaxial Growth of Y1Ba2Cu3O7-X Overlayers in Various Multilayered Thin-Films Lee S, Oh S, Goo D, Youm D |
305 - 312 |
Interlayer Energy-Transfer Between Chromophoric Carbazole and Oxacyanine in Langmuir-Blodgett-Films - Site Selectivity of Trapping Ohta N, Okazaki S, Yoshinari S, Yamazaki I |
313 - 316 |
Composition Monitoring Method in CuInSe2 Thin-Film Preparation Nishitani M, Negami T, Wada T |
317 - 324 |
Charge-Transport in Thin-Films of Molecular Semiconductors as Investigated by Measurements of Thermoelectric-Power and Electrical-Conductivity Meyer JP, Schlettwein D, Wohrle D, Jaeger NI |
325 - 332 |
Preparation and Characterization of Poly(Octyl 1,2-(2’,2"-Dithienylacrylate)) Thin-Films Jin ZS, Conn C, Unsworth J, Ediriweera RN, Kurusingal J, Pillai SM |
333 - 335 |
Microstructure of Gold Grown by Ion-Induced Deposition Ro JS, Thompson CV, Melngailis J |
336 - 340 |
Concentration-Dependent Redistribution of Arsenic in Silicon During Thermal-Oxidation Choi SS, Park MJ, Chu WK |
341 - 346 |
Formation of Anodic Alumina Films in Tungstate Ethylene-Glycol Electrolyte Morlidge JR, Shimizu K, Skeldon P, Thompson GE, Wood GC |
347 - 349 |
Activation-Energy of Hopping Conductivity in Low-Doped and Low-Compensated Semiconductor-Films Haroutunian SL, Haroutunian VA, Jivanian HA, Demirjian GH |