1 - 4 |
Structural Study of Epitaxial-Growth on Silicon Surfaces Ichimiya A, Nakahara H, Tanaka Y |
5 - 9 |
Structure and Growth Features of Tungsten Clusters Deposited on MgO(001) Surfaces Tanaka N, Kimata H, Kizuka T |
10 - 13 |
Microstructure of Germanium Films Crystallized by High-Energy Ion Irradiation Nakao S, Saitoh K, Ikeyama M, Niwa H, Tanemura S, Miyagawa Y, Miyagawa S |
14 - 16 |
Epitaxy of Co/Cu and Cu/Co Bilayers on MgO(111) Hayasaki H, Yamamoto M, Nishikawa K, Kingetsu T |
17 - 19 |
Heteroepitaxial Growth of InSb(111) on Si(111) Kitabatake M, Kawasaki T, Korechika T |
20 - 23 |
In-Situ Reflection Electron-Microscope Observation of 2-Dimensional Nucleation on Si(111) During Epitaxial-Growth Latyshev AV, Krasilnikov AB, Aseev AL |
24 - 27 |
Surface-Structure of Single-Crystal CeO2 Layers Grown on Si Inoue T, Yamamoto Y, Satoh M, Ide A, Katsumata S |
28 - 31 |
Heteroepitaxial Growth of Yttria-Stabilized Zirconia Film on Oxidized Silicon by Reactive Sputtering Horita S, Abe Y, Kawada T |
32 - 35 |
Epitaxy of Titanium Nitride Thin-Films Grown by Nitrogen Implantation Kasukabe Y, Ootubo J, Takeda S, Nagata S, Kishimoto M, Fujino Y, Yamaguchi S, Yamada Y |
36 - 38 |
Epitaxial-Growth of Silver on an Si(111) Root-3X-Root-3 Au Surface at Room-Temperature Ichimiya A, Iwashige H, Lijadi M |
39 - 42 |
Heteroepitaxy of KCl on KBr Substrate Natori A, Tanaka A, Yasunaga H |
43 - 45 |
Impurity Doping During Pb1-Xsnxse/CaF2 Epitaxial-Growth Suzuki M, Seki T |
46 - 51 |
Crystalline Quality of Alpha-Fe Films on Si(111) and Ge(111) Substrates Grown by Direct Ion-Beam Deposition Shimizu S, Sasaki N |
52 - 56 |
Langmuir Probe Evaluation of Ion-Bombardment During Ti-N Growth by Unbalanced Magnetron Sputtering Wiemer C, Levy F, Messier R |
57 - 59 |
An Atomic-Force Microscopy Study of Thin Copper-Oxide Films Grown by Molecular-Beam Epitaxy on MgO(100) Brazdeikis A, Karlsson UO, Flodstrom AS |
60 - 63 |
Growth of CeO2 Thin-Films by Metal-Organic Molecular-Beam Epitaxy Ikegawa S, Motoi Y |
64 - 67 |
Thermodynamic-Equilibrium and Mass-Transport Coupled Modeling of the Chemical-Vapor-Deposition Process Rouch H, Pons M, Benezech A, Bernard C, Madar R |
68 - 72 |
Monte-Carlo Simulation of the Variation of a Binary Alloy Film Composition Due to Intrinsic Resputtering Using Different Working Gases Bauer W, Betz G, Bangert H, Bergauer A, Eisenmengersittner C |
73 - 75 |
Phase-Transitions in Ultrathin Al Films on Si(111) Surfaces Groger R, Vonblanckenhagen P |
76 - 79 |
Ultrathin-Film of Cu on Alpha-Fe2O3(0001) Moller PJ, Guo QL, Gui LL |
80 - 83 |
In-Situ Observation of the Inplane Structure of C60 Thin-Films on Metal Substrates Prepared by Molecular-Beam Deposition Yoshida Y, Tanigaki N, Yase K |
84 - 89 |
Difference of Si Nodules Precipitating from Al-X Wt-Percent Si (X=0.5-Similar-to-3.3) Noritake C, Kondo I, Kondo K, Takenaka O, Kinbara A |
90 - 93 |
Chemical-State Analysis of Surface and Interface Segregates in Coevaporated Al-Sn-O Systems Kover L, Barna PB, Sanjines R, Kovacs Z, Margaritondo G, Adamik M, Radi Z |
94 - 97 |
Thin-Film Silicon Compound Growth Mechanisms - CrSi2/Si(001) Heck C, Kusaka M, Hirai M, Iwami M, Yokota Y |
98 - 101 |
Initial Plasma Oxidation-Kinetics of Silicon - DC Bias Effects Kamioka I, Nakamura KG, Kawabe T, Kitajima M |
102 - 104 |
Energy-Selective Electron-Cyclotron-Resonance Plasma for Controlled Surface-Reaction Processes Okeeffe P, Mutoh H, Den S, Hayashi Y, Komuro S, Morikawa T |
105 - 107 |
The Role of Neutral Oxygen Radicals in the Oxidation of Ag Films Schmidt AA, Offermann J, Anton R |
108 - 111 |
Model of Oxidation of Tin in Ion-Beam-Assisted Deposition Process Kubota H, Easterbrook M, Tokunaga M, Sakata I, Nagata M, Nicolet MA |
112 - 116 |
Electron-Beam-Induced Oxidation of Indium Particles Embedded in a Plasma Polymer Thin-Film Matrix Muller AD, Heilmann A, Muller F |
117 - 119 |
In-Depth Concentration Profile Equation for Cations in Thin Oxide Film Under the Inverse Logarithmic Growth Law of Low-Temperature Oxidation Ishikawa I |
120 - 123 |
Oxygen-Adsorption and Desorption Induced Surface Phase-Transition of SrCuO2(001) Ogasawara H, Sakuma T, Tsukakoshi M, Kawai M |
124 - 127 |
Comments on the Interdiffusivities Evaluated by the Decay-Rate of the Satellite Peak Measured by X-Ray-Diffraction Nittono O, Ando S |
128 - 131 |
Microstructure and Preferred Orientation in Pure Titanium Films Deposited by 2-Facing-Target-Type DC Sputtering Miyoshi T, Haga Y, Nittono O |
132 - 135 |
Columnar Structures in Fe-Based Metallic Multilayers Prepared with the Facing-Target-Type DC Sputtering Method Haga Y, Nittono O |
136 - 142 |
Large-Area Deposition - Sputtering-Systems and Pcvd-Systems and Techniques for LCD Hosokawa N |
143 - 145 |
Remote Deposition of Scratch Resistant Films by Use of Slot Antenna Microwave Plasma Source Korzec D, Traub K, Werner F, Engemann J |
146 - 148 |
Generation of Large-Area Disk-Shaped ECR Plasma for Diamond Deposition Murai A, Ohya I, Yasui T, Tahara H, Yoshikawa T |
149 - 151 |
A Rectangular Large ECR Plasma Source Tada S, Miyazawa W, Sakamoto Y, Den S, Hayashi Y |
152 - 154 |
Sheet-Shaped ECR Plasma Generation Using Permanent-Magnets for Material Processing Nakase K, Shibata T, Yasui T, Tahara H, Yoshikawa T |
155 - 158 |
Plasma-Enhanced CVD of Tin and Ti Using Low-Pressure and High-Density Helicon Plasma Tobe R, Sekiguchi A, Sasaki M, Okada S, Hosokawa N |
159 - 161 |
Thermoelectric-Power of Polycrystalline Si Films Prepared by Microwave Plasma Chemical-Vapor-Deposition Yonekubo S, Kamimura K, Onuma Y |
162 - 165 |
The Enhancement of Plasma Confining Effect at Low Gas-Pressure in the Sputtering Apparatus with Floating Potential Cathode Takahashi T, Iwatubo S, Asada M, Naoe M |
166 - 168 |
Effects of Magnet Behind the Target on Discharge and Sputtering Characteristics in the Sputtering Apparatus Takahashi T, Iwatubo S, Asada M, Naoe M |
169 - 171 |
New Plasma Source with an UHF (500 MHz) Antenna Nakagawa Y, Samukawa S, Ueyama H, Tsukada T, Shinohara K |
172 - 174 |
Excited Oxygen Beam by RF Type Multicapillary Ion-Source Okamoto A, Ogawa S, Ueno T, Fukui S |
175 - 178 |
Thin-Film Growth Using a High-Current, Mass-Separated Low-Energy Ion-Beam Deposition System Sasaki N, Shimizu S, Ogata S |
179 - 181 |
Transparent, Conductive Cui Films Prepared by RF-DC Coupled Magnetron Sputtering Tanaka T, Kawabata K, Hirose M |
182 - 185 |
Tin Films Prepared by Unbalanced Planar Magnetron Sputtering Under Control of Photoemission of Ti Tominaga K, Inoue S, Howson RP, Kusaka K, Hanabusa T |
186 - 189 |
Requirements for Sputtering Magnetic-Alloys on Organic Film Lippens P, Lievens H |
190 - 193 |
A Theory on Planar Magnetron Discharge Miura T, Asamaki T |
194 - 197 |
Ito Films Prepared by Facing Target Sputtering System Tominaga K, Ueda T, Ao T, Kataoka M, Mori I |
198 - 201 |
Large-Area Deposition of Ito Films by Cluster Type Sputtering System Ishibashi K, Watabe K, Hosokawa N |
202 - 205 |
Crystal-Growth of Ito Films Prepared by DC Magnetron Sputtering on C Film Morikawa H, Sumi H, Kohyama M |
206 - 208 |
The Effects of Oxygen-Content on Electrical and Optical-Properties of Indium Tin Oxide-Films Fabricated by Reactive Sputtering Honda S, Watamori M, Oura K |
209 - 212 |
Ozone in Reactive Gas for Producing Tin-Doped Indium Oxide-Films by DC Reactive Magnetron Sputtering Alam AH, Sasaki K, Hata T |
213 - 217 |
High-Rate Deposition of SiO2 by Modulated DC Reactive Sputtering in the Transition Mode Without a Feedback-System Ohsaki H, Tachibana Y, Shimizu J, Oyama T |
218 - 222 |
Physical-Properties of Evaporated Molybdenum Oxide-Films Miyata N, Suzuki T, Ohyama R |
223 - 227 |
DC Reactive Sputtering of Electroconductive Transparent Tin Suboxide Using a Sn-O-2/Ar System Ohsaki H |
228 - 231 |
Highly Conductive Transparent F-Doped Tin Oxide-Films Were Prepared by Photo-CVD and Thermal-CVD Ishida T, Tabata O, Park JI, Shin SH, Magara H, Tamura S, Mochizuki S, Mihara T |
232 - 234 |
Thin-Film Used to Obtain a Constant-Temperature Lower Than the Ambient Tazawa M, Jin P, Tanemura S |
235 - 238 |
Characterization of Niobium Oxide Electrochromic Thin-Films Prepared by Reactive DC Magnetron Sputtering Yoshimura K, Miki T, Iwama S, Tanemura S |
239 - 242 |
V1-Xmoxo2 Thermochromic Films Deposited by Reactive Magnetron Sputtering Jin P, Tanemura S |
243 - 245 |
Influence of Deposition Parameters on Layer Structure of Ag/C Multilayer Zone Plates for Use in Hard X-Ray Region Tamura S, Ohtani K, Kamijo N, Suzuki Y, Kihara H |
246 - 248 |
Modeling of Lift-Off Sputter-Deposition and Application to Fabrication of a Microlens Serikawa T, Shirai S |
249 - 251 |
Study of Optical Transient Relaxation of an Ag-O-Ba Thin-Film Wu JL, Wang CM, Wu QD, Xia ZJ, Zou YH |
252 - 255 |
Synthesis of Beta-Fesi2 for Optical Applications by Fe Triple-Energy Ion-Implantation into Si(100) and Si(111) Substrates Katsumata H, Makita Y, Kobayashi N, Hasegawa M, Shibata H, Uekusa S |
256 - 259 |
Diamond (111) and (100) Surface Reconstructions Scholze A, Schmidt WG, Bechstedt F |
260 - 263 |
In-Situ Optical Characterization of Carbon Layers Formed in the Initial-Stages of Diamond Growth Longueville JL, Moulin S, Bonnot AM |
264 - 266 |
Diamond Film Growth by Pulse-Modulated Magnetoactive Microwave Plasma Chemical-Vapor-Deposition Hatta A, Suzuki H, Kadota K, Ito T, Hiraki A |
267 - 270 |
Electrical-Properties of Boron-Doped Diamond Films Prepared by Microwave Plasma Chemical-Vapor-Deposition Deguchi M, Kitabatake M, Hirao T |
271 - 274 |
Ion-Implantation in Predoped CVD Diamond Yagyu H, Deguchi M, Mori Y, Hatta A, Ito T, Kitabatake M, Sakakima H, Hirao T, Hiraki A |
275 - 278 |
Formation of Paramagnetic Defects in CVD Diamond Films (ESR Study) Show Y, Nakamura Y, Izumi T, Deguchi M, Kitabatake M, Hirao T, Mori Y, Hatta A, Ito T, Hiraki A |
279 - 281 |
Ultrahigh Particle Density Seeding with Nanocrystal Diamond Particles Makita H, Nishimura K, Jiang N, Hatta A, Ito T, Hiraki A |
282 - 284 |
Electron-Microscopic Analysis of Chemical-Vapor-Deposited Diamond Surface by a Novel Method Jiang N, Hatta A, Won J, Mori Y, Ito T, Sasaki T, Hiraki A |
285 - 288 |
Study of Diamond Synthesized by Simple Hot-Filament-Assisted CVD in Various Conditions Kondo H, Endo T, Toyoshima K, Hirayoshi Y |
289 - 293 |
Carbon Nitride Thin-Films Deposited by the Reactive Ion-Beam Sputtering Technique Kobayashi S, Nozaki S, Morisaki H, Fukui S, Masaki S |
294 - 297 |
Fluorine-Containing Amorphous Hydrogenated Carbon-Films Durrant SF, Landers R, Kleiman GG, Castro SG, Demoraes MA |
298 - 301 |
Oxidation of Tin, Zrn, Tizrn, Crn, Ticrn and Tin/Crn Multilayer Hard Coatings Reactively Sputtered at Low-Temperature Panjan P, Navinsek B, Cvelbar A, Zalar A, Milosev I |
302 - 304 |
The Effects of Tl Impurities on the Properties of Amorphous SiC-H Films Prepared by Cosputtering Saito N, Inui Y, Yamaguchi T, Nakaaki I |
305 - 307 |
Improvement in the Stability of Amorphous Sin-BN Films Prepared by Hybrid-Plasma-Enhanced Chemical-Vapor-Deposition Yasui K, Itoh H, Akahane T |
308 - 310 |
Electrical, Optical and Structural-Properties of A-Singe-H Films Prepared by the RF Glow-Discharged Decomposition Nakaaki I, Saito N |
311 - 313 |
Highly Adhesive Tin Thin-Films Prepared on Glass by the Electron Shower Method Yumoto H, Kaneko K, Ishihara M, Kato Y, Akashi K |
314 - 317 |
X-Ray-Absorption and X-Ray Photoelectron Spectroscopic Studies of Air-Oxidized Chromium Nitride Thin-Films Esaka F, Shimada H, Imamura M, Matsubayashi N, Sato T, Nishijima A, Kawana A, Ichimura H, Kikuchi T, Furuya K |
318 - 320 |
Electron-Energy-Loss Fine-Structure Measurements of Silicon-Nitride Films Tsukajima J, Arai K, Takatoh S, Enokijima T, Hayashi T, Yikegaki T, Kashiwagi A, Tokunaga K, Suzuki T, Fujikawa T, Usami S |
321 - 323 |
Effect of Bias Voltage on AlN Thin-Films Prepared by Electron Shower Method Ishihara M, Yumoto H, Tsuchiya T, Akashi K |
324 - 326 |
Effects of RF Bias on Cubic BN Film Synthesis by Pulsed Nd-YAG Laser Deposition Suda Y, Nakazono T, Ebihara K, Baba K |
327 - 330 |
Boron-Nitride Hard Coatings by Ion-Beam and Vapor-Deposition Nishiyama S, Takahashi E, Iwamoto Y, Ebe A, Kuratani N, Ogata K |
331 - 333 |
Tribological Properties of RF Pacvd Amorphous B-N-C Coatings Dekempeneer EH, Meneve J, Kuypers S, Smeets J |
334 - 336 |
Structural and Electrical Characterization of Bc2N Thin-Films Watanabe MO, Sasaki T, Itoh S, Mizushima K |
337 - 339 |
Stress-Strain Curves of Sputtered Thin-Films of Ti-Ni Ishida A, Takei A, Sato M, Miyazaki S |
340 - 343 |
Effect of Nitrogen Gas-Pressure on Residual-Stress in AlN Films Deposited by the Planar Magnetron Sputtering System Kusaka K, Hanabusa T, Tominaga K |
344 - 347 |
Residual-Stress and Its Thermal Relaxation in Tin Films Matsue T, Hanabusa T, Ikeuchi Y |
348 - 351 |
Mechanisms of Reduction of the Internal-Stress in Hydrogenated Silicon-Oxide Films Prepared by Ar-H-2 Sputtering Takahashi H, Nishiguchi A, Nagata H, Kataoka H, Fujishima M |
352 - 355 |
Study on the Internal-Stress in Nickel Films Deposited Onto Silicon Substrates by Ion-Beam and Vapor-Deposition (Ivd) Kuratani N, Murakami Y, Imai O, Ebe A, Nishiyama S, Ogata K |
356 - 359 |
Improvement of the Adhesion to Polyimide Substrates of Copper-Films Prepared by an Ion-Beam and Vapor-Deposition (Ivd) Method Ebe A, Takahashi E, Iwamoto Y, Kuratani N, Nishiyama S, Imai O, Ogata K, Setsuhara Y, Miyake S |
360 - 363 |
Adhesion Fracture of a 2-Layer Au Evaporated Film with C, W and Cr Mixed Hosaka T |
364 - 367 |
Martensitic Transformations in Sputter-Deposited Ti-Ni-Cu Shape-Memory Alloy Thin-Films Miyazaki S, Hashinaga T, Ishida A |
368 - 371 |
Electron-Transport in Percolating Gold-Films Dumpich G, Friedrichowski S, Mikitisin P |
372 - 374 |
Fabrication and Characterization of Cuin(Sxse1-X)(2) Thin-Films Deposited by RF-Sputtering Yamamoto Y, Yamaguchi T, Demizu Y, Tanaka T, Yoshida A |
375 - 378 |
(Cd,Zn)S Thin-Films Prepared by Chemical Bath Deposition for Photovoltaic Devices Yamaguchi T, Yamamoto Y, Tanaka T, Demizu Y, Yoshida A |
379 - 382 |
Novel GaAs Photocathodes with Alkali Antimonide Intermediate Layers and Cesium-Oxygen Adlayers Guo TL |
383 - 385 |
Negative-Resistance Characteristics and Memory Phenomena in Electroformed Planar Metal-Films Nakashima H, Uozumi K |
386 - 389 |
Photoluminescence Analysis of CdS Thin-Films Under Phase-Transition Lozadamorales R, Zelayaangel O |
390 - 392 |
Structure of Gold-Hydrocarbon Composite Thin-Films Deposited Using Low-Voltage Plasma Sputtering Method Okamoto A, Nosaka T, Yoshitake M, Suzuki Y, Ogawa S |
393 - 396 |
Preparation of Pd Thin-Film Photo-Cathodes Using Ion-Beam Sputtering Nosaka T, Yoshitake M, Okamoto A, Suzuki Y, Ogawa S, Mima H |
397 - 400 |
High-Quality SiO2 Depositions from Teos by ECR Plasma Sano K, Hayashi S, Wickramanayaka S, Hatanaka Y |
401 - 403 |
Deposition of SiO2 and Ta2O5 Films by Electron-Beam-Excited Plasma Ion Plating Toki K, Kusakabe K, Odani T, Kobuna S, Shimizu Y |
404 - 408 |
Surface-Properties of SiOx Monolayer Photochemically Formed on Oxide Semiconductors Tada H, Tanaka M |
409 - 411 |
FTIR Spectroscopy and AES Study of Water Containment in SiO2 Thin-Films Demsar A, Colaric B, Rus S, Lindav J, Svegelj F, Orel B, Pracek B, Zalar A |
412 - 414 |
Thin Si Oxide-Films for MIS Tunnel Emitter by Hollow-Cathode Enhanced Plasma Oxidation Usami K, Takahashi I, Miyake E, Moriya M, Cai XY, Kobayashi T, Goto T |
415 - 418 |
Tantalum Oxide-Films on Silicon Grown by Tantalum Evaporation in Atomic Oxygen Hudner J, Hellberg PE, Kusche D, Ohlsen H |
419 - 422 |
Growth and Characterization of Ta2O5 Thin-Films on Si by Ion-Beam Sputter-Deposition Park KS, Lee DY, Kim KJ, Moon DW |
423 - 426 |
Investigation of the Effects of Pumping Speed and Ar/O-2 Ratio on the Transient Time at Mode Transition in Ti-O-2 Reactive Sputtering Kusano E, Kinbara A |
427 - 430 |
Characteristics of Rutile TiO2 Films Prepared by RF Magnetron Sputtering at a Low-Temperature Okimura K, Maeda N, Shibata A |
431 - 435 |
Surface-Morphology of Tiox Films Prepared by an Ion-Beam-Assisted Reactive Deposition Method Sasase M, Miyake K, Yamaki T, Takano I, Isobe S |
436 - 440 |
The Structural Characteristics of Vox Films Prepared by He-Introduced Reactive RF Unbalanced Magnetron Sputtering Miyazaki H, Utsuno F, Shigesato Y, Yasui I |
441 - 444 |
Velocity Analysis of Ablated Particles in Pulsed-Laser Deposition of NiO Film Tasaka Y, Kuroda H, Tanaka M, Usami S |
445 - 448 |
Preparation and Some Properties of Nitrogen-Mixed ZnO Thin-Films Sato Y, Sato S |
449 - 452 |
Growing BaTiO3 Thin-Films on Si(100) with MgO-Buffer Layers by Sputtering Kim S, Hishita S |
453 - 456 |
Transition-Metal Oxide-Films Prepared by Pulsed-Laser Deposition for Atomic-Beam Detection Tanaka M, Mukai M, Fujimori Y, Kondoh M, Tasaka Y, Baba H, Usami S |
457 - 459 |
C-Axis-Oriented PbTiO3 Thin-Films Prepared by Sputter-Assisted Plasma CVD Mihara T, Mochizuki S, Makabe R |
460 - 462 |
Oxidation of Zn Films by Irradiation with an Excited Metastable He Beam Koyanagi T, Fujii T, Oi R, Hironaga N, Matsubara K |
463 - 465 |
Preparation of PbTiO3 Thin-Films by Ion-Beam Sputtering Hashima H, Nakajima S, Suzuki Y, Ogawa S |
466 - 468 |
Selective Gas-Detection by Means of Surface-Plasmon Resonance Sensors Miwa S, Arakawa T |
469 - 473 |
Magnetic-Structure and Magnetoresistance of Metallic Multilayers Shinjo T |
474 - 483 |
Magnetic Thin-Films for High-Density Recording Lodder JC |
484 - 487 |
Magnetic and Structural-Properties of Fe Films Deposited by Ion-Beam Sputtering with a High-Energy Assisted Process Iwatsubo S, Takahashi T, Naoe M |
488 - 491 |
Growth-Kinetics of Thin Oxide Layers - Oxidation of Fe and Fe-N Phases at Room-Temperature Kooi BJ, Somers MA, Mittemeijer EJ |
492 - 495 |
Metastable Spin-States and Magnetic Anisotropies of Thin fcc Fe-Layers on Cu(100) Lorenz R, Hafner J |
496 - 498 |
Magnetoresistance and Magnetic-Properties of Ferromagnetic Multilayers Gondo Y, Suezawa Y |
499 - 502 |
Growth of Mnsb and Mn2Sb Epitaxial Layers on GaAs Substrates by Hot-Wall Epitaxy Tatsuoka H, Kuwabara H, Oshita M, Nakamura T, Fujiyasu H |
503 - 506 |
Preparation of Films of (Tb,Dy)Fe-2 Giant Magnetostrictive Alloy by Ion-Beam Sputtering Process and Their Characterization Wada M, Uchida HH, Matsumura Y, Uchida H, Kaneko H |
507 - 509 |
Xe+-Beam Sputtered YBa2Cu3Ox Thin-Films on Si Wafers Hatanaka K, Yokota K, Fujimoto H, Itoh T, Tatsumi M, Watanabe M, Takagi T |
510 - 512 |
The Influence of Bi-Sticking Coefficient in the Growth of Bi(2212) Thin-Film by Ion-Beam Sputtering Migita S, Sakai K, Ota H, Mori Z, Aoki R |
513 - 516 |
Digital Laser Etching of Bi-Sr-Ca-Cu-O Superconducting Thin-Films Oohira T, Sakai S, Kasai Y, Shimizu K |
517 - 520 |
Comparison Between Bi-Superconductor Thin-Films Fabricated via Codeposition and Layer-by-Layer Deposition by Ion-Beam Sputtering Method Mori Z, Ota H, Migita S, Sakai K, Aoki R |
521 - 524 |
2-Dimensionally Oriented Organic-Molecules as a Substrate for Vapor Growth of Zinc Thin-Films Lin H, Ando H, Seo WS, Kuwabara K, Koumoto K |
525 - 528 |
Quantitative Estimation of Organic Molecular-Beams by Using Quadrupole Mass-Spectroscopy Yase K, Yoshida Y |
529 - 532 |
Changes in Surface-Morphology and Optical-Properties of Polymers Induced by Ion-Implantation Ikeyama M, Hayakawa Y, Tazawa M, Nakao S, Saitoh K, Miyagawa Y, Miyagawa S |
533 - 535 |
Improvement of the Partial Discharge Resistance of Polymer-Films by Coating with Plasma-Polymerized Films Kusabiraki M, Aozasa M |
536 - 538 |
Plasma-Polymerized Acetylene Thin-Film by Pulsed Discharge Uchida T, Senda K, Vinogradov GK, Morita S |
539 - 541 |
Time-Dependence of Current of Plasma-Polymerized Polystyrene Thin-Film upon Exposure to NO2 Gas Takeda S |
542 - 544 |
Direct Observation of the Crystallization in El Organic Thin-Films by Total-Reflection X-Ray Diffractometer Orita K, Hayashi K, Horiuchi T, Matsushige K |
545 - 547 |
Production of a Bridge Structure Using Diamond Film Hoshikawa K, Kobayashi K, Watanabe T, Togashi F |
548 - 551 |
Surface-Structure of a Fluorinated Thiol on Au(111) by Scanning Force Microscopy Motomatsu M, Mizutani W, Nie HY, Tokumoto H |
552 - 555 |
Microstructure of Spark-Processed Blue Luminescent CdTe, GaSb, and InSb Gudinomartinez A, Falcony C, Vazquezlopez C, Navarro H, Vidal MA, Araujoosorio J, Cabanasmoreno JG |
556 - 561 |
Surface Geometry of MBE-Grown GaAs(001) Surface Phases Xue QK, Hashizume T, Sakata T, Hasegawa Y, Ichimiya A, Ohno T |
562 - 567 |
Investigation of Thin-Film Transistors Using a Combination of Focused Ion-Beam Etching and Cross-Sectional Transmission Electron-Microscopy Observation Tsuji S, Tsujimoto K, Tsutsui N, Miura N, Kuroda K, Saka H |
568 - 571 |
N-2-Plasma-Nitridation Effects on Porous Silicon Yokomichi H, Masuda A, Yonezawa Y, Shimizu T |
572 - 575 |
Electrochemical Nanolithography Using Scanning Probe Microscopy - Fabrication of Patterned Metal Structures on Silicon Substrates Sugimura H, Nakagiri N |
576 - 579 |
Instrumentation of a Wafer Inspection Large-Sample Atomic-Force Microscope Yasutake M, Wakiyama S, Kitamura M, Fujino N, Karino I, Oumori M |
580 - 583 |
Simulation of Atomic-Force Microscopy Image Variations Due to Tip Apex Size - Appearance of Half Spots Komiyama M, Tazawa K, Tsujimichi K, Hirotani A, Kubo M, Miyamoto A |
584 - 587 |
Properties of Nanophase Grains of Superconducting YBCO Prepared by Wet-Type Jet Mill Kezuka H, Xi ZH, Miyanaga Y, Kannari C |
588 - 590 |
STM Modification of MoS2 in the Nanometer-Scale Using a Gas-Solid Reaction Kohno M, Doi T, Hasegawa T, Tomimatsu S, Hosoki S |
591 - 593 |
Reconstruction of Heat-Treated 6H-SiC(0001) Surfaces - AES, STM Hirai M, Marumoto Y, Tsukamoto T, Kusaka M, Iwami M, Ozawa T, Nagamura T, Nakata T |
594 - 597 |
Scanning-Tunneling-Microscopy Study on Dynamic Structural Formation in Mixed Fatty-Acid Monolayers at Liquid/Graphite Interface Hibino M, Sumi A, Hatta I |
598 - 601 |
Molecular-Dynamics Simulation of Traction Fluid Molecules Under Ehl Condition Yamano H, Shiota K, Miura R, Katagiri M, Kubo M, Stirling A, Broclawik E, Miyamoto A, Tsubouchi T |
602 - 605 |
Initial-Stage of C-60 Film Growth and Reaction on Si(111) 7X7 and Graphite Surfaces Studied by HREELS-STM Suto S, Kasuya A, Hu CW, Wawro A, Sakamoto K, Goto T, Nishina Y |
606 - 609 |
Nanofabrication on N-GaAs Surface Using a Scanning Tunneling Microscope in a Ni-Salt Solution Kaneshiro C, Okumura T |
610 - 612 |
Visible-Light Emission from the Porous Alloyed Pt/Si Contacts Ichinohe T, Nozaki S, Morisaki H |
613 - 617 |
High-Resolution Electron-Microscopy of Gd-at-C-82 Metal Fullerenes Grown on MgO(001) Surfaces Tanaka N, Honda Y, Kawahara M, Kishida M, Shinohara H |
618 - 623 |
C60 Single-Crystal Films on GaAs(001) Surfaces Xue QK, Ling Y, Ogino T, Sakata T, Hasegawa Y, Hashizume T, Shinohara H, Sakurai T |
624 - 629 |
Friction-Force Microscopy of Peptide Filament - An Application to Estimate the Size of a Supramolecular Unit Masai J, Shibataseki T, Ogawa Y, Sato K, Yanagawa H |
630 - 633 |
New Fast Atom Beam Processing with Separated Masks for Fabricating Multiple Microstructures Ichiki K, Hatakeyama M, Tanaka S, Nakao M, Hatamura Y |
634 - 636 |
Development of a Mesoscale/Nanoscale Plasma Generator Terashima K, Howald L, Haefke H, Guntherodt HJ |
637 - 639 |
Scanning Tunneling Microscope-Induced Oxidation of Hydrogen Passivated Silicon Surfaces Kramer N, Vandenberg MR, Schonenberger C |
640 - 643 |
Nanoscale Al Patterning on an STM-Manipulated Si Surface Ono T, Hamanaka H, Kurabayashi T, Minami K, Esashi M |
644 - 646 |
Development of UHV-STM/STS at 2 K Hattori K, Iimori T, Komori K |
647 - 650 |
Development of a Near-Field Optical-System for Investigating Thin Organic Films Nagahara LA, Tokumoto H |
651 - 653 |
Micromachine-Actuator Rotated by Rarefied-Gas Effects Kasahara K, Ota M, Sakamoto M |